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Fig.36, Fig.35 – KYORITSU 6016 User Manual

Page 41

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38

However it is also good practice to consider even more stringent trip time limits, by following
the standard values of trip times at I△n defined by IEC 61009 (EN 61009) and IEC 61008
(EN 61008). These trip time limits are listed in the table below for IΔn and 5I△n:

Type of RCD

IΔn

5IΔn

General(G)

300ms

max allowed value

40ms

max allowed value

Selective(S)

500ms

max allowed value

150ms

max allowed value

130ms

min allowed value

50ms

min allowed value

Examples of instrument connections
Practical example of 3-phase + neutral RCD test in a TT system.

Practical example of single phase RCD test in a TN system.

×1

ms

30 mA

230V

L-PE

UL50

V

PHASE : 0

°

50.0Hz

L-PE

L-N

!

Fig.35

×1

ms

30 mA

230V

L-PE

UL50

V

PHASE : 0

°

50.0Hz

L-PE

L-N

!

Fig.36