Littelfuse PGB20402 Series User Manual
Pulseguard, Suppressors, Pgb2 series halogen free / lead-free
![background image](/manuals/292066/1/background.png)
www.littelfuse.com
©2011 Littelfuse
PGB2 Series
Specifications are subject to change without notice.
1
Revised: March 8, 2011
PulseGuard
®
Suppressors
Surface Mount Polymeric ESD Suppressors
PulseGuard ESD Suppressors help protect sensitive
electronic equipment against electrostatic discharge (ESD).
They use polymer composite materials to suppress fast-
rising ESD transients (as specified in IEC 61000-4-2), while
adding virtually no capacitance to the circuit.
They supplement the on-chip protection of integrated
circuitry and are best suited for low-voltage, high-speed
applications where low capacitance is important to ensure
minimal interference of data signal integrity.
The new and ultra-small surface mount PGB2 0402 series
offers a RoHS Compliant, Halogen Free, and 100% Lead
Free circuit protection alternative.
PGB2 Series Halogen Free / Lead-Free
Description
Features
Applications
t)%57)BSEXBSF
t-BQUPQ%FTLUPQ
Computer
t/FUXPSL)BSEXBSF
t$PNQVUFS1FSJQIFSBMT
t%JHJUBM$BNFSB
t&YUFSOBM4UPSBHF
t4FU5PQ#PY
t"OUFOOB
t3P)4DPNQMJBOU
t-FBEGSFF
t)BMPHFOGSFF
t6MUSBMPXDBQBDJUBODF
t-PXMFBLBHFDVSSFOU
t'BTUSFTQPOTFUJNF
t0OFMJOFPGQSUFDUJPO
t#JEJSFDUJPOBM
t8JUITUBOETNVMUJQMF
&4%TUSJLFT
t$PNQBUJCMFXJUI
QJDLBOEQMBDFQSPDFTTFT
Equivalent Circuits
2
1
Product Characteristics
Part Number
Lines Protected
Component Package
PGB2010402KRHF
1
0402
Electrical Characteristics
Specification
PGB2010402
Notes
ESD Capability:
IEC 61000-4-2 Direct Discharge
*&$"JS%JTDIBSHF
L7
L7
5SJHHFS7PMUBHF UZQJDBM
$MBNQJOH7PMUBHF UZQJDBM
7
7
Measured per IEC 61000-4-2
L7%JSFDU%JTDIBSHF.FUIPE
5SJHHFS7PMUBHF UZQJDBM
$MBNQJOH7PMUBHF UZQJDBM
7
7
.FBTVSFEVTJOH75-1%JSFDU
Discharge Method
3BUFE7PMUBHF NBYJNVN
7%$ NBY
Capacitance (typical)
0.07 pF, typical
Measured at 250 MHz
Response Time
<1nS
Measured per IEC 61000-4-2
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-FBLBHF$VSSFOU UZQJDBM
O"
.FBTVSFEBU7%$
&4%1VMTF8JUITUBOE
1000 pulses min
Some shifting in characteristics may
occur when tested over multiple
pulses at a very rapid rate