Rainbow Electronics ATA5577 - Manual (Page 7)

7
4967DS–RFID–10/08
ATA5577 [Preliminary]
7. Revision History
10.1
Data retention
Top = 55°C (3) t
retention
10 20 50 Years Q
10.2 Top = 150°C (3) t
retention
96 hrs T
10.3 Top = 250°C (3) t
retention
24 hrs Q
11.1
Resonance capacitor
Mask option
V
coil pp
= 1V
C
r
320 330 340
pF
T
11.2 242 250 258
11.3 TBD 130 TBD
11.4 TBD 75 TBD
11.5 TBD 10 TBD Q
12.1
Micromodule capacitor
parameters
Capacitance tolerance
T
amb
C
r
320 330 340 pF T
12.2 Temperature coefficient TBD TBD TBD TBD TBD TBD
6. Electrical Characteristics (Continued)
T
amb
= +25°C; f
coil
= 125 kHz; unless otherwise specified
No. Parameters Test Conditions Symbol Min. Typ. Max. Unit Type*
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data
Notes: 1. I
DD
measurement set-up R = 100k
Ω
; V
CLK
= V
coil
= 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation
defeat. I
DD
= (V
OUTmax
– V
CLK
) / R
2. Current into Coil1/Coil2 is limited to 10 mA.
3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on
uncut wafer) delivery.
Please note that the following page numbers referred to in this section refer to the specific revision
mentioned, not to this document.
Revision No. History
4967DS-RFID-10/08
•
Features on page 1 changed
4967CS-RFID-01/08
•
Features on page 1 changed
•
Section 2 “Compatibility” on page 2 changed
•
Section 4.9 “Mode Register” on page 4 changed
4967BS-RFID-09/07
•
Put datasheet in a new template
•
Section 4.2 “Data-rate Generator” on page 3 changed
•
Figure 4-2 “Memory Map” on page 5 changed
•
Section 6 “Electrical Characteristics” numbers 2.1, 2.2 and 2.3 on page 6
changed