Revision history, Ata5577 [preliminary, Electrical characteristics (continued) – Rainbow Electronics ATA5577 User Manual
Page 7

7
4967DS–RFID–10/08
ATA5577 [Preliminary]
7.
Revision History
10.1
Data retention
Top = 55°C
(3)
t
retention
10
20
50
Years
Q
10.2
Top = 150°C
(3)
t
retention
96
hrs
T
10.3
Top = 250°C
(3)
t
retention
24
hrs
Q
11.1
Resonance capacitor
Mask option
V
coil pp
= 1V
C
r
320
330
340
pF
T
11.2
242
250
258
11.3
TBD
130
TBD
11.4
TBD
75
TBD
11.5
TBD
10
TBD
Q
12.1
Micromodule capacitor
parameters
Capacitance tolerance
T
amb
C
r
320
330
340
pF
T
12.2
Temperature coefficient
TBD
TBD
TBD
TBD
TBD
TBD
6.
Electrical Characteristics (Continued)
T
amb
= +25°C; f
coil
= 125 kHz; unless otherwise specified
No.
Parameters
Test Conditions
Symbol
Min.
Typ.
Max.
Unit
Type*
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data
Notes:
1. I
DD
measurement set-up R = 100k
Ω
; V
CLK
= V
coil
= 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation
defeat. I
DD
= (V
OUTmax
– V
CLK
) / R
2. Current into Coil1/Coil2 is limited to 10 mA.
3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on
uncut wafer) delivery.
Please note that the following page numbers referred to in this section refer to the specific revision
mentioned, not to this document.
Revision No.
History
4967DS-RFID-10/08
•
Features on page 1 changed
4967CS-RFID-01/08
•
Features on page 1 changed
•
Section 2 “Compatibility” on page 2 changed
•
Section 4.9 “Mode Register” on page 4 changed
4967BS-RFID-09/07
•
Put datasheet in a new template
•
Section 4.2 “Data-rate Generator” on page 3 changed
•
Figure 4-2 “Memory Map” on page 5 changed
•
Section 6 “Electrical Characteristics” numbers 2.1, 2.2 and 2.3 on page 6
changed