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Revision history, Ata5577 [preliminary, Electrical characteristics (continued) – Rainbow Electronics ATA5577 User Manual

Page 7

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7

4967DS–RFID–10/08

ATA5577 [Preliminary]

7.

Revision History

10.1

Data retention

Top = 55°C

(3)

t

retention

10

20

50

Years

Q

10.2

Top = 150°C

(3)

t

retention

96

hrs

T

10.3

Top = 250°C

(3)

t

retention

24

hrs

Q

11.1

Resonance capacitor

Mask option
V

coil pp

= 1V

C

r

320

330

340

pF

T

11.2

242

250

258

11.3

TBD

130

TBD

11.4

TBD

75

TBD

11.5

TBD

10

TBD

Q

12.1

Micromodule capacitor
parameters

Capacitance tolerance
T

amb

C

r

320

330

340

pF

T

12.2

Temperature coefficient

TBD

TBD

TBD

TBD

TBD

TBD

6.

Electrical Characteristics (Continued)

T

amb

= +25°C; f

coil

= 125 kHz; unless otherwise specified

No.

Parameters

Test Conditions

Symbol

Min.

Typ.

Max.

Unit

Type*

*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data

Notes:

1. I

DD

measurement set-up R = 100k

Ω

; V

CLK

= V

coil

= 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation

defeat. I

DD

= (V

OUTmax

– V

CLK

) / R

2. Current into Coil1/Coil2 is limited to 10 mA.

3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on

uncut wafer) delivery.

Please note that the following page numbers referred to in this section refer to the specific revision
mentioned, not to this document.

Revision No.

History

4967DS-RFID-10/08

Features on page 1 changed

4967CS-RFID-01/08

Features on page 1 changed

Section 2 “Compatibility” on page 2 changed

Section 4.9 “Mode Register” on page 4 changed

4967BS-RFID-09/07

Put datasheet in a new template

Section 4.2 “Data-rate Generator” on page 3 changed

Figure 4-2 “Memory Map” on page 5 changed

Section 6 “Electrical Characteristics” numbers 2.1, 2.2 and 2.3 on page 6
changed