Rose Electronics Porter - Manual (Page 31)

PORTER INSTALLATION AND OPERATIONS MANUAL
27
Diagnostic
You can execute some special diagnostic tests to determine if the Porter has any
problems. There are three groups of tests as shown below.
The short test, which is exactly the same as the power up test, is executed by pressing
both ADVVANCE and SELECT while powering up the unit. The long test without loopback
is selected by powering on while holding in the SELECT switch only. The long test with
loopback (which requires loopback connectors as described below) is selected by
powering on while holding in the ADVANCE switch only.
The long tests do a more extensive memory test and do tests on the ports. For this
reason, all devices (except the loopback connectors on the loopback test) must be
disconnected from the unit’s ports when the long tests are running. The short test is
similar to the power up test but continuously cycles, and allows reloading of the factory
default settings. The tests continuously cycle and halt if an error is determined. See
Tables V and VI for the various LED displays.
Diagnostic Tests
Short Test
This group of tests is entered by pressing both the ADVANCE and SELECT switches while
powering up the unit. They are also executed once on every power-up. These tests are
exactly the same tests as those performed during power up sequence. You enter this
state for a continuous test of the Porter functions or to reload the factory default settings
as described below.
Test 1 – EPROM program checksum test
Test 2 – Buffer memory sizing and read/write test
Test 3 – Static ram read/write test
Test 4 – Non-Volatile ram checksum test
Tests 1 – 4 are the same as the power-up test.
Long test without loopback
This group of tests are entered by pressing the SELECT switch only while powering up
the unit with the on/off switch. All equipment should be disconnected from the Porter
prior to running this test.
Test 1 – EPROM program checksum test
This test is the same as the “Short Test” described above.
Test 2 – Extended dynamic ram test
This test checks the dynamic ram more extensively than the short test or the power up
test. The test takes longer to perform. If this test fails (see Table VI) then the unit must
be serviced. Other LEDs may be lit also indicating the amount of memory that is installed
(see Table V). The failing board and memory device can be determined by pressing the
ADVANCE switch. The BUF LED will be lit if the failing board is the base mother board or
the bottom-most memory board installed. The DATA LED will be lit if the failing board is
the second from the bottom. The BUSY LED will be lit for the third board, and the LED
#0 will be lit for the fourth board. The LEDs 1-8 correspond to the physical placement of
the failing chip. If the failing chip is the one all the way to the left, then LED 1 will be lit.
If the failing chip is the one all the way to the right, then LED 8 will be lit. The chips in the
middle correspond appropriately. Hitting the SELECT switch will retry the test. In order
to bypass this test completely, both the ADVANCE and SELECT switches may be
pressed.