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Switching characteristics – Cypress CY7C1339G User Manual

Page 10

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CY7C1339G

Document #: 38-05520 Rev. *F

Page 10 of 18

Switching Characteristics

Over the Operating Range

[12, 13, 14, 15, 16, 17]

Parameter

Description

–250 –200

–166

–133

Unit

Min.

Max.

Min.

Max.

Min.

Max.

Min.

Max.

t

POWER

V

DD

(Typical) to the first Access

[12]

1

1

1

1

ms

Clock

t

CYC

Clock Cycle Time

4.0

5.0

6.0

7.5

ns

t

CH

Clock HIGH

1.7

2.0

2.5

3.0

ns

t

CL

Clock LOW

1.7

2.0

2.5

3.0

ns

Output Times

t

CO

Data Output Valid After CLK Rise

2.6

2.8

3.5

4.0

ns

t

DOH

Data Output Hold After CLK Rise

1.0

1.0

1.5

1.5

ns

t

CLZ

Clock to Low-Z

[13, 14, 15]

0

0

0

0

ns

t

CHZ

Clock to High-Z

[13, 14, 15]

2.6

2.8

3.5

4.0

ns

t

OEV

OE LOW to Output Valid

2.6

2.8

3.5

4.0

ns

t

OELZ

OE LOW to Output Low-Z

[13, 14, 15]

0

0

0

0

ns

t

OEHZ

OE HIGH to Output High-Z

[13, 14, 15]

2.6

2.8

3.5

4.0

ns

Set-up Times

t

AS

Address Set-up Before CLK Rise

1.2

1.2

1.5

1.5

ns

t

ADS

ADSC, ADSP Set-up Before CLK Rise

1.2

1.2

1.5

1.5

ns

t

ADVS

ADV Set-up Before CLK Rise

1.2

1.2

1.5

1.5

ns

t

WES

GW, BWE, BW

X

Set-up Before CLK Rise

1.2

1.2

1.5

1.5

ns

t

DS

Data Input Set-up Before CLK Rise

1.2

1.2

1.5

1.5

ns

t

CES

Chip Enable Set-Up Before CLK Rise

1.2

1.2

1.5

1.5

ns

Hold Times

t

AH

Address Hold After CLK Rise

0.3

0.5

0.5

0.5

ns

t

ADH

ADSP, ADSC Hold After CLK Rise

0.3

0.5

0.5

0.5

ns

t

ADVH

ADV Hold After CLK Rise

0.3

0.5

0.5

0.5

ns

t

WEH

GW, BWE, BW

X

Hold After CLK Rise

0.3

0.5

0.5

0.5

ns

t

DH

Data Input Hold After CLK Rise

0.3

0.5

0.5

0.5

ns

t

CEH

Chip Enable Hold After CLK Rise

0.3

0.5

0.5

0.5

ns

Notes:

12. This part has a voltage regulator internally; t

POWER

is the time that the power needs to be supplied above V

DD

(minimum) initially before a read or write operation

can be initiated.

13. t

CHZ

, t

CLZ

,t

OELZ

, and t

OEHZ

are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.

14. At any given voltage and temperature, t

OEHZ

is less than t

OELZ

and t

CHZ

is less than t

CLZ

to eliminate bus contention between SRAMs when sharing the same

data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve High-Z prior to Low-Z under the same system conditions.

15. This parameter is sampled and not 100% tested.
16. Timing reference level is 1.5V when V

DDQ

= 3.3V and is 1.25V when V

DDQ

= 2.5V.

17. Test conditions shown in (a) of AC Test Loads unless otherwise noted.

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