Data retention and endurance, Capacitance, Thermal resistance – Cypress CY14B101Q3 User Manual
Page 14: Ac test conditions
PRELIMINARY
CY14B101Q1
CY14B101Q2
CY14B101Q3
Document #: 001-50091 Rev. *A
Page 14 of 22
AC Test Conditions
Input Pulse Levels.................................................... 0V to 3V
Input Rise and Fall Times (10% - 90%) ....................... <3 ns
Input and Output Timing Reference Levels.....................1.5V
Data Retention and Endurance
Parameter
Description
Min
Unit
DATA
R
Data Retention
20
Years
NV
C
Nonvolatile STORE Operations
200
K
Capacitance
Parameter
Description
Test Conditions
Max
Unit
C
IN
Input Capacitance
T
A
= 25
°C, f = 1MHz,
V
CC
= 3.0V
6
pF
C
OUT
Output Pin Capacitance
8
pF
Thermal Resistance
Parameter
Description
Test Conditions
8-SOIC
8-DFN
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test
methods and procedures for measuring
thermal impedance, per EIA / JESD51.
TBD
TBD
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
TBD
TBD
°C/W
Figure 20. AC Test Loads and Waveforms
3.0V
OUTPUT
5 pF
R1
R2
789
Ω
3.0V
OUTPUT
30 pF
R1
R2
789
Ω
577
Ω
577
Ω
Note
6. These parameters are guaranteed by design and are not tested.