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Capacitance, Thermal resistance, Ac test loads and waveforms – Cypress CY7C1316JV18 User Manual

Page 21

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CY7C1316JV18, CY7C1916JV18
CY7C1318JV18, CY7C1320JV18

Document Number: 001-15271 Rev. *B

Page 21 of 26

Capacitance

Tested initially and after any design or process change that may affect these parameters.

Parameter

Description

Test Conditions

Max

Unit

C

IN

Input

Capacitance

T

A

= 25

°C, f = 1 MHz, V

DD

= 1.8V, V

DDQ

= 1.5V

5

pF

C

CLK

Clock Input Capacitance

6

pF

C

O

Output Capacitance

7

pF

Thermal Resistance

Tested initially and after any design or process change that may affect these parameters.

Parameter

Description

Test Conditions

165 FBGA

Package

Unit

Θ

JA

Thermal Resistance
(Junction to Ambient)

Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.

28.51

°C/W

Θ

JC

Thermal Resistance
(Junction to Case)

5.91

°C/W

AC Test Loads and Waveforms

1.25V

0.25V

R = 50

Ω

5 pF

INCLUDING

JIG AND

SCOPE

ALL INPUT PULSES

Device

R

L

= 50

Ω

Z

0

= 50

Ω

V

REF

= 0.75V

V

REF

= 0.75V

[19]

0.75V

Under
Test

0.75V

Device
Under
Test

OUTPUT

0.75V

V

REF

V

REF

OUTPUT

ZQ

ZQ

(a)

Slew Rate = 2 V/ns

RQ =
250

Ω

(b)

RQ =
250

Ω

Notes

19. Unless otherwise noted, test conditions assume signal transition time of 2V/ns, timing reference levels of 0.75V, V

REF

= 0.75V, RQ = 250

Ω, V

DDQ

= 1.5V, input pulse

levels of 0.25V to 1.25V, and output loading of the specified I

OL

/I

OH

and load capacitance shown in (a) of

AC Test Loads and Waveforms

.

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