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Capacitance, Ac test loads and waveforms, Data retention characteristics – Cypress CY62157CV33 User Manual

Page 5: Data retention waveform

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CY62157CV30/33

Document #: 38-05014 Rev. *F

Page 5 of 13

Capacitance

[7]

Parameter

Description

Test Conditions

Max.

Unit

C

IN

Input Capacitance

T

A

= 25°C, f = 1 MHz,

V

CC

= V

CC(typ.)

6

pF

C

OUT

Output Capacitance

8

pF

AC Test Loads and Waveforms

V

CC

Typ

V

CC

OUTPUT

R2

30 pF

INCLUDING

JIG AND

SCOPE

GND

90%

10%

90%

10%

OUTPUT

V

TH

Equivalent to:

THÉVENIN EQUIVALENT

ALL INPUT PULSES

R

TH

R1

Rise TIme: 1 V/ns

Fall Time: 1 V/ns

Parameters

3.0V

3.3V

Unit

R1

1.105

1.216

ΚΩ

R2

1.550

1.374

ΚΩ

R

TH

0.645

0.645

ΚΩ

V

TH

1.75

1.75

V

Data Retention Characteristics

(Over the Operating Range)

Parameter

Description

Conditions

Min.

Typ.

[2]

Max.

Unit

V

DR

V

CC

for Data Retention

1.5

V

I

CCDR

Data Retention Current

V

CC

= 1.5V, CE

1

> V

CC

– 0.2V or

CE

2

< 0.2V,

V

IN

> V

CC

– 0.2V or V

IN

< 0.2V

Auto-A

4

20

µA

Auto-E

4

60

µA

t

CDR

[8]

Chip Deselect to Data
Retention Time

0

ns

t

R

[8]

Operation Recovery Time

t

RC

ns

Data Retention Waveform

[9]

Notes:

8. Full Device AC operation requires linear V

CC

ramp from V

DR

to V

CC(min.)

> 100

µs or stable at V

CC(min.)

>100

µs.

9. BHE.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signals or by disabling both BHE and BLE.

V

CC(min.)

V

CC(min.)

t

CDR

V

DR

> 1.5 V

DATA RETENTION MODE

t

R

CE

1

or

V

CC

BHE.BLE

CE

2

or

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