beautypg.com

Thermal resistance, Ac test loads and waveforms, Data retention characteristics – Cypress CY62138EV30 User Manual

Page 4: Data retention waveform

background image

CY62138EV30

MoBL

®

Document #: 38-05577 Rev. *A

Page 4 of 9

Thermal Resistance

Parameter

Description

Test Conditions

BGA

Unit

Θ

JA

Thermal Resistance
(Junction to Ambient)

Still Air, soldered on a 3 x 4.5 inch, four-layer
printed circuit board

72

°C/W

Θ

JC

Thermal Resistance
(Junction to Case)

8.86

°C/W

AC Test Loads and Waveforms

Parameters

2.50V

3.0V

Unit

R1

16667

1103

R2

15385

1554

R

TH

8000

645

V

TH

1.20

1.75

V

Data Retention Characteristics

(Over the Operating Range)

Parameter

Description

Conditions

Min.

Typ.

[3]

Max.

Unit

V

DR

V

CC

for Data Retention

1

V

I

CCDR

Data Retention Current

V

CC

= 1V, CE > V

CC

− 0.2V,

V

IN

> V

CC

− 0.2V or V

IN

< 0.2V

0.8

3

µA

t

CDR

[7]

Chip Deselect to Data Retention Time

0

ns

t

R

[8]

Operation Recovery Time

t

RC

ns

V

CC

V

CC

OUTPUT

R2

30 pF

INCLUDING

JIG AND

SCOPE

GND

90%

10%

90%

10%

OUTPUT

V

TH

Equivalent to: THÉVENIN EQUIVALENT

ALL INPUT PULSES

R

TH

R1

Fall time: 1 V/ns

Rise Time: 1 V/ns

Data Retention Waveform

Notes:

7. Tested initially and after any design or process changes that may affect these parameters.
8. Full Device AC operation requires linear V

CC

ramp from V

DR

to V

CC(min.)

> 100

µs or stable at V

CC(min.)

> 100 µs.

1.5V

t

CDR

V

DR

> 1.5 V

DATA RETENTION MODE

t

R

CE

V

CC

V

CC

(min.)

[+] Feedback