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Maximum ratings, Operating range, Electrical characteristics – Cypress CY7C1329H User Manual

Page 8

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CY7C1329H

Document #: 38-05673 Rev. *B

Page 8 of 16

Maximum Ratings

(Above which the useful life may be impaired. For user guide-
lines, not tested.)

Storage Temperature ................................. –65

°C to +150°C

Ambient Temperature with
Power Applied............................................. –55

°C to +125°C

Supply Voltage on V

DD

Relative to GND ....... –0.5V to +4.6V

Supply Voltage on V

DDQ

Relative to GND ...... –0.5V to +V

DD

DC Voltage Applied to Outputs
in Tri-State............................................–0.5V to V

DDQ

+ 0.5V

DC Input Voltage ................................... –0.5V to V

DD

+ 0.5V

Current into Outputs (LOW) ........................................ 20 mA

Static Discharge Voltage ......................................... > 2001V
(per MIL-STD-883, Method 3015)

Latch-up Current ................................................... > 200 mA

Operating Range

Range

Ambient

Temperature

V

DD

V

DDQ

Commercial

0°C to +70°C

3.3V

–5%/+10%

2.5V –5%

to V

DD

Industrial

–40°C to +85°C

Electrical Characteristics

Over the Operating Range

[8, 9]

Parameter

Description

Test Conditions

Min.

Max.

Unit

V

DD

Power Supply Voltage

3.135

3.6

V

V

DDQ

I/O Supply Voltage

for 3.3V I/O

3.135

V

DD

V

for 2.5V I/O

2.375

2.625

V

V

OH

Output HIGH Voltage

for 3.3V I/O, I

OH

= –4.0 mA

2.4

V

V

for 2.5V I/O, I

OH

= –1.0 mA

2.0

V

V

V

OL

Output LOW Voltage

for 3.3V I/O, I

OL

= 8.0 mA

0.4

V

for 2.5V I/O, I

OL

= 1.0 mA

0.4

V

V

IH

Input HIGH Voltage

[8]

for 3.3V I/O

2.0

V

DD

+ 0.3V

V

for 2.5V I/O

1.7

V

DD

+ 0.3V

V

V

IL

Input LOW Voltage

[8]

for 3.3V I/O

–0.3

0.8

V

for 2.5V I/O

–0.3

0.7

V

I

X

Input Leakage Current
except ZZ and MODE

GND

≤ V

I

≤ V

DDQ

–5

5

µA

Input Current of MODE Input = V

SS

–30

µA

Input = V

DD

5

µA

Input Current of ZZ

Input = V

SS

–5

µA

Input = V

DD

30

µA

I

OZ

Output Leakage Current GND

≤ V

I

≤ V

DDQ,

Output Disabled

–5

5

µA

I

DD

V

DD

Operating Supply

Current

V

DD

= Max., I

OUT

= 0 mA,

f = f

MAX

= 1/t

CYC

6-ns cycle,166 MHz

240

mA

7.5-ns cycle,133 MHz

225

mA

I

SB1

Automatic CS
Power-down
Current—TTL Inputs

V

DD

= Max, Device

Deselected, V

IN

≥ V

IH

or

V

IN

≤ V

IL,

f = f

MAX

= 1/t

CYC

6-ns cycle, 166 MHz

100

mA

7.5-ns cycle,133 MHz

90

mA

I

SB2

Automatic CS
Power-down
Current—CMOS Inputs

V

DD

= Max, Device

Deselected, V

IN

≤ 0.3V or

V

IN

> V

DDQ

– 0.3V, f = 0

All speeds

40

mA

I

SB3

Automatic CS
Power-down
Current—CMOS Inputs

V

DD

= Max, Device

Deselected, or V

IN

≤ 0.3V

or V

IN

> V

DDQ

– 0.3V,

f = f

MAX

= 1/t

CYC

6-ns cycle, 166 MHz

85

mA

7.5-ns cycle,133MHz

75

mA

I

SB4

Automatic CS
Power-down
Current—TTL Inputs

V

DD

= Max, Device

Deselected, V

IN

≥ V

IH

or

V

IN

≤ V

IL

, f = 0

All speeds

45

mA

Notes:

8. Overshoot: V

IH

(AC) < V

DD

+1.5V (Pulse width less than t

CYC

/2), undershoot: V

IL

(AC) > –2V (Pulse width less than t

CYC

/2).

9. T

Power-up

: Assumes a linear ramp from 0v to V

DD

(min.) within 200 ms. During this time V

IH

< V

DD

and V

DDQ

< V

DD

.

10. Tested initially and after any design or process change that may affect these parameters.

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