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Flashback substitution events – HP IO Accelerator for BladeSystem c-Class User Manual

Page 40

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Monitoring IO Accelerator health 40

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Flashback substitution events

The IO Accelerator is equipped with Flashback substitution capability. This capability allows for predictive

NAND flash failures to occur and keep the IO Accelerator functioning by substituting out bad locations or
even a whole NAND chip. The output of the fio-status –a command will show if any flashback

substitution events have occurred.
The following is an example of the output after entering the fio-status –a command. The numbers

represent the bank (0-3) and chip number that was substituted.
First flashback event -> No action to take as infant mortality condition on NAND

chip was caught per design.
Second flashback event –> Run fio-bugreport. Return the card (if under warranty)

when you see two or more flashback substitution events.

Flashback active on (bank a/chip m) and (bank b/chip n) (multi-bank failure)

Flashback active on (bank a/chip m) and (bank b/chip m) (chip failure)

On the second flashback event, include the output from running the fio-bugreport command when you

return the card.