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AMD Am79C930 User Manual

Page 56

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AMD

P R E L I M I N A R Y

56

Am79C930

The following is a brief summary of the IEEE 1149.1
compatible test functions implemented in the
Am79C930 device:

Boundary Scan Circuit

The boundary scan test circuit uses five pins: TRST,
TCK, TMS, TDI, and TDO. These five pins are collec-
tively labeled the TAP. The boundary scan test circuit in-
cludes a finite state machine (FSM), an instruction
register, and a data register array. Internal pull-up resis-
tors are provided for the TDI and TMS pins. The TCK pin
must not be left unconnected.

TAP FSM

The TAP engine is a 16-state FSM, driven by the Test
Clock (TCK) and the Test Mode Select (TMS) pins. This
FSM is in its reset state at power up or after H_RESET.
The

TRST

pin is supported in order to ensure that the

FSM is in the TEST_LOGIC_RESET state before test-
ing is begun.

Supported Instructions

In addition to the minimum IEEE 1149.1 requirements
(BYPASS, EXTEST, and SAMPLE instructions), one
additional instruction (IDCODE) is provided as addi-
tional support for board level testing.

All unused instruc-

tion decodes are reserved.

Instruction Name

Instruction Code

Mode

Selected Data Register

Description

EXTEST

0000

Test

BSR

External Test

ID_CODE

0001

Normal

ID

REG ID Code Inspection

SAMPLE

0010

Normal

BSR

Sample Boundary

Reserved

0011–1110

Reserved

Reserved

Reserved

BYPASS

1111

Normal Bypass

Bypass

Scan

Instruction Register and Decoding Logic

After H_RESET or S_RESET, the IDCODE instruction
is always loaded into the IEEE 1149.1 register. The de-
coding logic gives signals to control the data flow in the
DATA registers according to the current instruction.

Boundary Scan Register (BSR)

Each BSR cell has two stages. A flip-flop and a latch
are used for the SERIAL SHIFT STAGE and for the
PARALLEL OUTPUT STAGE, respectively.

There are four possible operation modes in the
BSR cell:

1

Capture

2

Shift

3

Update

4

System Function

Other Data Registers

(1) BYPASS REGISTER (1 BIT)

(2) DEVICE ID REGISTER (32 BITS)

(3) INSCAN0

Device ID Register Contents:

Bits 31–28:

Version

Bits 27–12:

Part Number (0010 1000 0101 0000)

Bits 11–1:

Manufacturer ID. The 11 bit manufacturer
ID code for AMD is 00000000001 in accor-
dance with JEDEC publication 106-A.

Bit 0:

Always a logic 1

This is an internal scan path for AMD internal
testing use.

Power Saving Modes

Power Down Function

The Am79C930 BIU includes five registers that are used
to invoke a power-down function that will support the
IEEE 802.11 (draft) specified power down by allowing
variable lengths of power-down and power-up time. The
registers include the Processor Interface Register
(MIR0), which contains the Power Down command bit, a
Power Down Length Count set of registers (MIR2,3,4),
and a Power Up Clock Timer (MIR1) register. The power
down sequence is executed by the firmware running
on the embedded 80188, either independently, or in
response to a request from the host. In the PCMCIA