Memory bus read access – AMD Am79C930 User Manual
Page 139
P R E L I M I N A R Y
AMD
139
Am79C930
AC CHARACTERISTICS
3.3 V MEMORY BUS INTERFACE
ABSOLUTE MAXIMUM RATINGS
Storage Temperature:
–65 to +150
°
C
. . . . . . . . . . . .
Ambient Temperature Under Bias:
–65 to +125
°
C
. . .
Supply Voltage to AV
SS
or DV
SS
(AV
DD
, DV
DD
):
–0.3 to +6 V
. . . . . . . . . . . . . .
Stresses above those listed under Absolute Maximum
Ratings may cause permanent device failure. Functionality at
or above these limits is not implied. Exposure to Absolute
Maximum Ratings for extended periods may affect
device reliability.
OPERATING RANGES
Commercial (C) Devices
Temperature (T
A
)
0
°
C to + 70
°
C
. . . . . . . . . . . . . . . . .
Supply Voltages (V
CC
,V
DDT
, V
DDU1
, V
DDU2
, V
DDM
, V
DDP
)
3.0 V to 5.25 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Supply Voltages
(AV
DD
, V
DD5
)
+5 V
±
5%
. . . . . . . . . . . . . . . . . . . . . . . .
All inputs within the range: V
SS
– 0.5 V
≤
V
IN
≤
V
DD
+ 0.1 X
V
DD
– where V
SS
and V
DD
are appropriate reference pins
for a given input pin. (See section on power supply
pin descriptions.)
CL = 50 pF unless otherwise noted
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
MEMORY BUS READ ACCESS
Parameter
Symbol
Parameter Description
Test Conditions
Min
Max
Unit
t
m
AD
MA[16:0] valid from CLKIN
↓
2
100
ns
t
m
CD
CE
active delay from CLKIN
↓
Note 1
2
100
ns
t
m
OD
MOE
active delay from CLKIN
↓
2
100
ns
t
m
OLZ
MOE
↓
to MD[7:0] driven
0 wait states
0
70
ns
(Note 3)
1 wait state
170
ns
2 wait states
270
ns
t
m
AA
Address Read Access Time
0 wait states
120
ns
(Note 3)
1 wait state
220
ns
2 wait states
320
ns
t
m
ACS
CE
Read Access Time
0 wait states
120
ns
(Notes 1, 3)
1 wait state
220
ns
2 wait states
320
ns
t
m
OE
MOE
Read Access Time
0 wait states
70
ns
(Note 3)
1 wait state
170
ns
2 wait states
270
ns
t
m
RI
CE
Inactive Time
Notes 1, 2
0
ns
t
m
AH
MA[16:0] valid hold from
MOE
↑
Note 1
T
CLKIN
-10
ns
t
m
CH
CE
valid hold from
MOE
↑
T
CLKIN
-10
ns
t
m
H
MD[7:0] valid hold from
MOE
↑
Note 2
0
ns
t
m
HZ
MD[7:0] inactive from
MOE
↑
Note 2
0
2 X T
CLKIN
-15
ns
Notes:
1.
CE
= one of:
FCE
,
SCE
,
XCE
2. Parameter not included in the production test.
3. Value is dependent upon TCLKIN value. Value given is for CLKIN = 20 MHz.