Atec Agilent-3000-X Series - Manual (Page 8)

8
Segmented memory
When capturing low-duty cycle pulses or data bursts, you
can use segmented memory acquisition to optimize acqui-
sition memory. Segmented memory acquisition not only
lets you selectively capture and store important segments
of signals without capturing unimportant signal idle/
deadtime, but it also allows you to run post-capture inter-
segment analysis such as segment play back, waveform
measurements, and waveform overlay. Segmented memory
acquisition is ideal for applications including packetized
serial buses, pulsed laser, radar bursts and high-energy
physics experiments. Up to 1000 segments can be captured
on the 3000 X-Series models with a minimum re-arm time
under 1 μs. Segmented memory works simultaneously with
serial bus decodes as well.
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Power Measurement and Analysis
When working with switching power supplies and power
devices, the DSOX3PWR power measurements application
provides a full suite of power measurements and analysis
that runs in the oscilloscope. Measurements include:
• Current harmonics
• Efficiency
• Inrush current
• Modulation
• Power quality
• Switching response
• Transient response
• Turn on/turn off
• Output ripple
• Power Supply Rejection Ratio (PSRR)
• Slew rate
Also included at no additional charge is a license for
the U1881A PC-based power analysis software package
which provides additional offline measurements and report
generation. U1881A additional measurements include:
• Safe operating area (SOA)/SOA mask editor
• Dynamic on resistance (Rds)
• On/offline analysis
Capture 1000 very infrequent glitches over 100 seconds
using segmented memory, then run inter-segment
measurement and overlay analysis on the 1000 segments.
An example screen for power quality analysis