Atec Agilent-infiniium-90000 Series - Manual (Page 27)

27
Infiniium 90000A Series Oscilloscopes
Performance characteristics
Measurements and math (continued)
Waveform measurements
Voltage
Time
Mixed
Frequency domain
Level qualification
Peak to peak, minimum, maximum, average, RMS, amplitude, base, top, overshoot, preshoot, upper,
middle, lower
Rise time, fall time, period, frequency, positive width, negative width, duty cycle, burst width,
Tmin, Tmax, Tvolt, setup time (requires Option 002, 004, or 070 standard on DSA models), hold
time (requires Option 002, 004, or 070 standard on DSA models), channel-to-channel delta time,
channel-to-channel phase
Area, slew rate
FFT frequency, FFT magnitude, FFT delta frequency, FFT delta magnitude
Any channels that are not involved in a measurement can be used to level-qualify all timing
measurements
Eye-diagram measurements Eye height, eye width, eye jitter, crossing percentage, Q factor, and duty-cycle distortion
Jitter analysis measurements
Clock
Data
Timing
Fast eye rendering increases speed of the eye diagram rendering
Requires Option 002 (or E2681A), 004 (or N5400A), or 070 (or N8823A). Standard on DSA Series.
Time interval error (TIE) clock with TIE band, high, low-pass filter, cycle-cycle jitter, N-cycle jitter,
cycle-cycle + width, cycle-cycle width, cycle-cycle duty cycle
Time interval error (TIE) data with TIE band, high, low-pass filter, data rate, unit interval, clock
recovery rate, burst time, burst period, burst interval
Two sources: Setup time, hold time, phase, advanced
One source: Period, frequency, + width, width, duty cycle, burst width, rise time, fall time, slew rate
Statistics Displays the current, mean, minimum, maximum, range (max-min), standard deviation, number of
measurements value for the displayed automatic measurements
Histograms
Source
Orientation
Measurements
Waveform or measurement 12
Vertical (for timing and jitter measurements) or horizontal (noise and amplitude change) modes,
regions are defined using waveform markers
Mean, standard deviation, mean ± 1, 2, and 3 sigma, median, mode, peak-to-peak, min, max, total
hits, peak (area of most hits), X scale hits, and X offset hits
Mask testing Allows pass/fail testing to user-defined or Agilent-supplied waveform templates. Automask lets
you create a mask template from a captured waveform and define a tolerance range in time/voltage
or screen divisions. Test modes (run until) include test forever, test to specified time or event limit,
and stop on failure. Executes “multipurpose” user setting on failure. “Unfold real time eye” feature
will allow individual bit errors to be observed by unfolding a real time eye when clock recovery is
on. Communications mask test kit option provides a set of ITU-T G.703, ANSI T1.102, and IEEE 802.3
industry-standard masks for compliance testing.
Waveform math
Number of functions
Hardware Accelerated Math
Operators
16
Differential and Common Mode
Absolute value, add, amplitude modulation, average, Butterworth
9 , common mode, delay,
differentiate, divide, FFT magnitude, FFT phase, FIR 9 , high pass filter, histogram (measurement),
horizontal gate, integrate, invert, LFE 9 , low pass filter (4th-order Bessel Thompson filter), magnify,
max, measurement trend, min, multiply, RT Eye 9 , smoothing, SqrtSumOfSquare 9 , square, square root,
subtract, versus, and optional user defined function (Option 010)
FFT
Frequency range
4
Frequency resolution
Best resolution at
maximum sample rate
Frequency accuracy
DC up to 20 GHz (at 40 GSa/s) or 10 GHz (at 20 GSa/s)
Sample rate/memory depth = resolution
91304A/91204A/90804A: 800 Hz
90604A/90404A/90254A: 400 Hz
(1/2 frequency resolution) + (1 x 10-6)(signal frequency)