Introduction, Lightwave source characterization, Lightwave receiver characterization – Atec Agilent-8703A User Manual
Page 2: Optical device characterization, Microwave device characterization
A powerful combination of calibrated 20 GHz lightwave
and microwave measurement capabilities is described in
this Agilent 8703A technical specifications. This includes
the following models and options:
Agilent 8703A Lightwave Component Analyzer
• Option 100 Adds External Lightwave Source Input
• Option 210 1550 nm DFB
1
Laser
• Option 220 1300 nm DFB Laser
• Option 300 Adds One Lightwave Receiver
Agilent 83424A Lightwave CW Source
• Option 100 Adds External Lightwave Source Input
Agilent 83425A Lightwave CW Source
• Option 100 Adds External Lightwave Source Input
With accuracy, speed and convenience, the 8703A
performs the optical, electrical, and electro-optical
measurement types listed below. This data can be shown
in magnitude, phase and distance-time measurement
formats. A performance summary is in Table 2. Following
Table 2 is a block diagram and detailed operating
conditions and specifications.
Additional configuration information can be found in the
8703A configuration guide (Agilent literature number
5966-4827E).
1 “DFB” is an abbreviation for Distributed Feedback Laser.
Lightwave source characterization
(electrical-in and optical-out)
Source slope responsivity tests
• Modulation bandwidth
• Modulated output power flatness
• Step response
• Modulation signal group delay and differential phase
• Reflected signal sensitivity
• Distance-time response
Optical reflection tests
• Port return loss
• Distance-time response
Electrical reflection tests
• Port impedance or return loss
• Distance-time response
Lightwave receiver characterization
(optical-in and electrical-out)
Receiver slope responsivity tests
• Modulation bandwidth
• Modulated output power flatness
• Step response
• Modulation signal group delay and differential
phase
• Distance-time response
Optical reflection tests
• Port return loss
• Distance-time response
Electrical reflection tests
• Port impedance or return loss
• Distance-time response
Optical device characterization
(optical-in and optical-out)
Optical transfer function tests
• Insertion loss or gain
• Modulated output power
flatness
• Step response .
• Modulation signal group delay and differential
phase
• Distance-time response
• Modal dispersion
Optical reflection response tests
• Port return loss
• Distance-time response
Microwave device characterization
(electrical-in and electrical-out)
Electrical transfer function tests
• Insertion loss or gain
• Output power flatness
• Step response
• Group delay and deviation from linear phase
• Distance-time response
Electrical reflection response tests
• Port impedance or return loss
• Distance-time response
Table 1. Types of
measurements performed with
the Agilent 8703A
2
Introduction