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Introduction, Lightwave source characterization, Lightwave receiver characterization – Atec Agilent-8703A User Manual

Page 2: Optical device characterization, Microwave device characterization

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A powerful combination of calibrated 20 GHz lightwave
and microwave measurement capabilities is described in
this Agilent 8703A technical specifications. This includes
the following models and options:

Agilent 8703A Lightwave Component Analyzer

• Option 100 Adds External Lightwave Source Input
• Option 210 1550 nm DFB

1

Laser

• Option 220 1300 nm DFB Laser
• Option 300 Adds One Lightwave Receiver

Agilent 83424A Lightwave CW Source

• Option 100 Adds External Lightwave Source Input

Agilent 83425A Lightwave CW Source

• Option 100 Adds External Lightwave Source Input

With accuracy, speed and convenience, the 8703A
performs the optical, electrical, and electro-optical
measurement types listed below. This data can be shown
in magnitude, phase and distance-time measurement
formats. A performance summary is in Table 2. Following
Table 2 is a block diagram and detailed operating
conditions and specifications.

Additional configuration information can be found in the
8703A configuration guide (Agilent literature number
5966-4827E).

1 “DFB” is an abbreviation for Distributed Feedback Laser.

Lightwave source characterization

(electrical-in and optical-out)

Source slope responsivity tests

• Modulation bandwidth
• Modulated output power flatness
• Step response
• Modulation signal group delay and differential phase
• Reflected signal sensitivity
• Distance-time response

Optical reflection tests

• Port return loss
• Distance-time response

Electrical reflection tests

• Port impedance or return loss
• Distance-time response

Lightwave receiver characterization

(optical-in and electrical-out)

Receiver slope responsivity tests

• Modulation bandwidth
• Modulated output power flatness
• Step response
• Modulation signal group delay and differential

phase

• Distance-time response

Optical reflection tests

• Port return loss
• Distance-time response

Electrical reflection tests

• Port impedance or return loss
• Distance-time response

Optical device characterization

(optical-in and optical-out)

Optical transfer function tests

• Insertion loss or gain
• Modulated output power

flatness

• Step response .
• Modulation signal group delay and differential

phase

• Distance-time response
• Modal dispersion

Optical reflection response tests

• Port return loss
• Distance-time response

Microwave device characterization

(electrical-in and electrical-out)

Electrical transfer function tests

• Insertion loss or gain
• Output power flatness
• Step response
• Group delay and deviation from linear phase
• Distance-time response

Electrical reflection response tests

• Port impedance or return loss
• Distance-time response

Table 1. Types of
measurements performed with
the Agilent 8703A

2

Introduction