Q-Tech SPACE OCXO - Manual (Page 5)

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Q-TECH Corporation - 10150 W. Jefferson Boulevard, Culver City 90232 - Tel: 310-836-7900 - Fax: 310-836-2157 - www.q-tech.com
LOW PHASE NOISE, SPACE LEVEL OCXO
3.3 to 15Vdc - 1MHz to 125MHz
Q-TECH
CORPORATION
QPDS-0008 (Revision B, April 2013 ) (ECO# 10835)
Element De-rating
All active and passive elements shall be derated in accordance with the applicable hybrid microcircuit element requirements of
MIL-STD-975. Elements shall not operate in excess of de-rated values.
Worst Case Circuit Analysis
Worst case analysis shall be based on:
a. Maximum rated value
b. The worst case design value
c. Derating factor for each element
d. Temperature variation
e. Radiation
MTBF
Mean Time between Failure analysis shall be done based on MIL-HDBK-217
Element Evaluation
All piece parts shall be derived from lots that meet the element evaluation requirements of MIL-PRF-38534, Class K except for
the following exceptions:
Active Elements
a) Visual inspection of silicon on sapphire microcircuits. Semicircular crack(s) or multiple adjacent cracks, not in the active
area, starting and terminating at the edge of the die are acceptable. Attached (chip in place) sapphire is nonconductive
material and shall not be considered as foreign material and will be considered as nonconductive material for all
inspection criteria.
b) Subgroup 4, Scanning Electron Microscope (SEM) inspection. The manufacturer may allow the die distributor, at his
option, select two (2) dice from a waffle pack (containing a maximum quantity of 100 die), visually inspect for the worst
case metallization of the 2 dice, and take SEM photographs of the worst case.
c) Subgroup 5 radiation tests. Subgroup 5 radiation tests are not required unless otherwise specified in the detail
specification.
Package Elements
a) Salt spray. Salt spray testing is not required.
Quartz Crystal Material
Unless otherwise specified by the detail specification, the quartz Crystal material shall be swept synthetic, grade 2.2 or better.
Crystal Mounting
The crystal element shall be four-point mounted in such a manner as to assure adequate crystal performance when the oscillator
is subjected to the environmental conditions specified herein.
Design and Construction
The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the oscillators shall meet the design and
construction requirements of MIL-PRF-55310.