Rainbow Electronics DAB-IMU-C01 User Manual
Page 4
ADIS16250/ADIS16255
Rev. B | Page 4 of 20
Parameter Conditions
Min
Typ
Max
Unit
DAC OUTPUT
5 kΩ/100 pF to GND
Resolution
12
Bits
Relative Accuracy
For Code 101 to Code 4095
4
LSB
Differential Nonlinearity
1
LSB
Offset Error
±5
mV
Gain Error
±0.5
%
Output Range
0 to 2.5
V
Output Impedance
2
Ω
Output Settling Time
10
μs
LOGIC INPUTS
Input High Voltage, V
INH
2.0
V
Input Low Voltage, V
INL
0.8
V
For CS signal when used to wake up from
sleep mode
0.55
V
Logic 1 Input Current, I
INH
V
IH
= 3.3 V
±0.2
±10
μA
Logic 0 Input Current, I
INL
V
IL
= 0 V
All except RST
−40
−60
μA
RST
−1
mA
Input Capacitance, C
IN
10
pF
DIGITAL OUTPUTS
Output High Voltage, V
OH
I
SOURCE
= 1.6 mA
2.4
V
Output Low Voltage, V
OL
I
SINK
= 1.6 mA
0.4
V
SLEEP TIMER
Timeout Period
0.5
128
sec
START-UP TIME
Initial
160
ms
Sleep Mode Recovery
2.5
ms
FLASH MEMORY
Endurance
20,000
Cycles
Data Retention
T
J
= 55°C
20
Years
CONVERSION RATE
Minimum Conversion Time
3.906
ms
Maximum Conversion Time
7.75
sec
Maximum Throughput Rate
256
SPS
Minimum Throughput Rate
0.129
SPS
POWER SUPPLY
Operating Voltage Range, V
CC
4.75 5.0 5.25 V
Power Supply Current
Normal mode at 25°C
18
mA
Fast mode at 25°C
44
mA
Sleep mode at 25°C
425
μA
1
ADIS16255 characterization data represents ±4σ to fall within the ±1% limit.
2
The sensor is capable of ±600°/sec, but the specifications herein are for ±320°/sec only.
3
The RST pin has an internal pull-up.
4
Guaranteed by design.
5
Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
6
Retention lifetime equivalent at junction temperature (T
J
) 55°C, as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.