Rainbow Electronics ATF1502ASL User Manual
Features, Enhanced features
1
Features
•
High-density, High-performance, Electrically-erasable Complex Programmable
Logic Device
– 32 Macrocells
– 5 Product Terms per Macrocell, Expandable up to 40 per Macrocell
– 44 Pins
– 7.5 ns Maximum Pin-to-pin Delay
– Registered Operation up to 125 MHz
– Enhanced Routing Resources
•
In-System Programmability (ISP) via JTAG
•
Flexible Logic Macrocell
– D/T Latch Configurable Flip-flops
– Global and Individual Register Control Signals
– Global and Individual Output Enable
– Programmable Output Slew Rate
– Programmable Output Open Collector Option
– Maximum Logic Utilization by Burying a Register with a COM Output
•
Advanced Power Management Features
•
Automatic 10 µA Standby for “L” Version
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Pin-controlled 1 mA Standby Mode
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Programmable Pin-keeper Inputs and I/Os
•
Reduced-power Feature per Macrocell
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Available in Commercial and Industrial Temperature Ranges
•
Available in 44-lead PLCC and TQFP
•
Advanced EEPROM Technology
– 100% Tested
– Completely Reprogrammable
– 10,000 Program/Erase Cycles
– 20-year Data Retention
– 2000V ESD Protection
– 200 mA Latch-up Immunity
•
JTAG Boundary-scan Testing to IEEE Std. 1149.1-1990 and 1149.1a-1993 Supported
•
PCI-compliant
•
Security Fuse Feature
Enhanced Features
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Improved Connectivity (Additional Feedback Routing, Alternate Input Routing)
•
Output Enable Product Terms
•
D Latch Mode
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Combinatorial Output with Registered Feedback within Any Macrocell
•
Three Global Clock Pins
•
ITD (Input Transition Detection) Circuits on Global Clocks, Inputs and I/O
(“L” versions)
•
Fast Registered Input from Product Term
•
Programmable “Pin-keeper” Option
•
V
CC
Power-up Reset Option
•
Pull-up Option on JTAG Pins TMS and TDI
•
Advanced Power Management Features
– Input Transition Detection
– Power-down (“L” versions)
– Individual Macrocell Power Option
– Disable ITD on Global Clocks, Inputs and I/O
High-
performance
EEPROM CPLD
ATF1502AS
ATF1502ASL
Rev. 0995J–PLD–09/02
Document Outline
- Features
- Enhanced Features
- Description
- Block Diagram
- Programmable Pin-keeper Option for Inputs and I/Os
- Input Diagram
- I/O Diagram
- Speed/Power Management
- Design Software Support
- Power-up Reset
- Security Fuse Usage
- Programming
- ISP Programming Protection
- JTAG-BST/ISP Overview
- JTAG Boundary-scan Cell (BSC) Testing
- BSC Configuration for Input and I/O Pins (Except JTAG TAP Pins)
- BSC Configuration for Macrocell
- PCI Compliance
- PCI Voltage-to- current Curves for +5V Signaling in Pull-up Mode
- PCI Voltage-to- current Curves for +5V Signaling in Pull-down Mode
- PCI DC Characteristics (Preliminary)
- PCI AC Characteristics (Preliminary)
- Power-down Mode
- Power-down AC Characteristics(1)(2)
- Absolute Maximum Ratings*
- DC and AC Operating Conditions
- DC Characteristics
- Pin Capacitance(1)
- Timing Model
- Input Test Waveforms and Measurement Levels
- Output AC Test Loads
- AC Characteristics(1)
- ATF1502AS Dedicated Pinouts
- ATF1502AS I/O Pinouts
- Ordering Information
- Using “C” Product for Industrial
- Packaging Information