Pin description – Rainbow Electronics MAX16066 User Manual
Page 9
12-Channel/8-Channel, Flash-Configurable System
Managers with Nonvolatile Fault Registers
MAX16065/MAX16066
_______________________________________________________________________________________ 9
Pin Description
PIN
NAME
FUNCTION
MAX16065
MAX16066
1–6, 43–46
1–5, 36–40
MON1–
MON10
Monitor Voltage Inputs. Set monitor voltage range through configuration
registers. Measured value written to ADC register can be read back through the
SMBus or JTAG interface.
47, 48
—
MON11,
MON12
Monitor Voltage Inputs. Set monitor voltage range through configuration
registers. Measured value written to ADC register can be read back through the
SMBus or JTAG interface.
7
6
CSP
Current-Sense Amplifier Positive Input. Connect CSP to the source side of the
external sense resistor.
8
7
CSM
Current-Sense Amplifier Negative Input. Connect CSM to the load side of the
external sense resistor.
9
8
RESET
Configurable Reset Output
10
9
TMS
JTAG Test Mode Select
11
10
TDI
JTAG Test Data Input
12
11
TCK
JTAG Test Clock
13
12
TDO
JTAG Test Data Output
14
13
SDA
SMBus Serial-Data Open-Drain Input/Output
15
14
A0
Four-State SMBus Address. Address sampled upon POR.
16
15
SCL
SMBus Serial-Clock Input
17, 42
16, 35
GND
Ground
20–25
17–22
GPIO1–
GPIO6
General-Purpose Input/Outputs. GPIO_s can be configured to act as a TTL input,
a push-pull, open-drain, or high-impedance output or a pulldown circuit during a
fault event.
18, 19
—
GPIO7,
GPIO8
General-Purpose Input/Outputs. GPIO_s can be configured to act as a TTL input,
a push-pull, open-drain, or high-impedance output or a pulldown circuit during a
fault event or reverse sequencing.
26–29
—
EN_OUT12–
EN_OUT9
Outputs. Set EN_OUT_ with active-high/active-low logic and with push-pull or
open-drain configuration. EN_OUT_ can be asserted by a combination of IN_
voltages configurable through the flash.
30–37
23–30
EN_OUT1–
EN_OUT8
Outputs. Set EN_OUT_ with active-high/active-low logic and with push-pull or
open-drain configuration. EN_OUT_ can be asserted by a combination of IN_
voltages configurable through the flash. EN_OUT1–EN_OUT8 can be configured
with a charge-pump output (+10V above GND) that can drive an external
n-channel MOSFET.
38
31
EN
Analog Enable Input. All outputs deassert when V
EN
is below the enable
threshold.
39
32
DBP
Digital Bypass. All push-pull outputs are referenced to DBP. Bypass DBP with a
1FF capacitor to GND.
40
33
V
CC
Device Power Supply. Connect V
CC
to a voltage from 2.8V to 14V. Bypass V
CC
with a 10FF capacitor to GND.
41
34
ABP
Analog Bypass. Bypass ABP with a 1FF ceramic capacitor to GND.
—
—
EP
Exposed Pad. Internally connected to GND. Connect to ground, but do not use
as the main ground connection.