Test information, Figure 22, Figure 21 – Philips TDA5051A User Manual
Page 20: Tda5051a, Nxp semiconductors, Home automation modem
TDA5051A
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Product data sheet
Rev. 5 — 13 January 2011
20 of 29
NXP Semiconductors
TDA5051A
Home automation modem
13. Test information
Fig 21. Test set-up for measuring demodulation delay
(1) Square wave TTL signal 300 Hz, duty factor = 50 % for measuring signal bandwidth
(see
(2) DATA_IN + LOW for measuring total harmonic distortion (see
(3) Tuned for f
cr
= 132.5 kHz.
(4) The CISPR16 network provides a
−6 dB attenuation.
Fig 22. Test set-up for measuring THD and bandwidth of the TX_OUT signal
30
Ω
1
μF
10 nF
XTAL
DATA_IN
DATA_OUT
t
d(dem)(su)
t
d(dem)(h)
DATA_OUT
DATA_IN
TX_OUT/RX_IN
OSCILLOSCOPE
Y1
TDA5051A
(to be tested)
pulse
generator
300 Hz
50 %
Y2
TX_OUT
RX_IN
f
osc
2
1
10
14
7
8
002aaf051
G
002aaf052
TDA5051A
POWER
SUPPLY
SPECTRUM
ANALYZER
50
Ω
10
7
8
OSC1
OSC2
12, 5, 9
1
13, 3, 11
TX_OUT
AGND, DGND, APGND
V
DDA
, V
DDD
, V
DDAP
5
Ω
50
Ω
10
μF
33 nF
250 nF
47
μH
50
μH
33 nF 47
μH
coupling network
(3)
CISPR16 network
(4)
+5 V
(2)
(1)
DATA_IN
G
250 nF
5
Ω
50
μH
002aaf052
TDA5051A
POWER
SUPPLY
SPECTRUM
ANALYZER
50
Ω
10
7
8
OSC1
OSC2
12, 5, 9
1
13, 3, 11
TX_OUT
AGND, DGND, APGND
V
DDA
, V
DDD
, V
DDAP
5
Ω
50
Ω
10
μF
33 nF
250 nF
47
μH
50
μH
33 nF 47
μH
coupling network
(3)
CISPR16 network
(4)
+5 V
(2)
(1)
DATA_IN
G
250 nF
5
Ω
50
μH