Kontron AT8402 Diagnostics Manual - Manual (Page 8)

Overview AT8402
Page 1 - 2 AT8402 CLI Reference Manual
1. Overview
The diagnostics for the AT8402 Kontron Carrier board is integrated in a specially
prepared image included in the Carrier firmware. It includes diagnostics for:
•
Broadcom BCM Ethernet Switch (BCM_xxx)
• CPLD onboard programmable logic device (CPLD_xxx)
• Telecom Clock Prodection Switch (TELCO_xxx)
• FUM Firmware Update Manager (FUM_xxx)
• IPMI Controller (IPMC_xxx)
• PowerPC IBM Host Processor (PPC_xxx)
• PLX PCI Express SWitch (PLX_xxx)
Diagnostics are designed to run on the board under control of a local test sequencer.
The diagnostics are designed to run in a controlled diagnostic environment. The tests
are grouped by major functional blocks they relate to (Test case). Tests are written as
test procedures where each procedure covers a specific functional block. The test-
sequencer selects different test procedures to execute. It also retrieves results and
progress indication from the test procedures.
Description of Test categories
Test group Test group is allways Diagnostics.
Test case Test case name in diagnostic test-suite is meant as an grouping of differ-
ent test procedures for a certain part of the board (SAS, PPC, CPLD, ...)
Test procedure Test procedure name as reported in journal and online
Test host Carrier
Test IC either quickturn or full
Test mode normal or destructive
Diagnostic code Diagnostic codes produced by this test procedure in case of failures.
1.1 Test scenarios
Different test scenarios can be started. A scenario is a sequence of test procedures.
The following scenarios are currently defined:
quickturn:
The scenario quickturn contains tests executing quickly, but no
destructive tests (TestIC=quickturn)
full: The scenario complete contains all tests but the destructive ones
(TestIC=full)
write: The scenario write contains only destructive tests (TestIC=full, Test
Mode = destructive)
If test mode is destructive the system will need some kind of re-initial-
ization after running this test-procedure (e.g. reprogramming of per-
manent storage) Failure of destructive tests may leave the board
unusable.