Metrohm NIRS XDS MultiVial Analyzer - Manual (Page 61)

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The “visible” portion of the
spectrum is similar. A
linearization is applied to this
portion of the spectrum.
Minor artifacts appear in these
raw spectra due to detector
crossover and other
spectroscopic reasons. After
linearization these artifacts are
minimal or not evident, some
being beyond the usable range
of the instrument.
These peak positions are not meant to be
traceable, as the true wavelength
calibration of the instrument is done on
an external standard, traceable to NIST.
The internal wavelength materials are
used to maintain the external wavelength
registration by use of software
adjustment for any external effects on
the instrument.
Select Wavelength Linearization from the
Diagnostics menu. The instrument will
scan the ceramic reference.