Rockwell Automation 1747-SDN 1747-SDN DeviceNet Scanner Installation Instructions - Manual (Page 16)

16 1747-SDN DeviceNet Scanner Module
Publication 1747-IN058F-EN-P - December 2010
Specifications
98 Unrecoverable firmware failure. Service or replace your module.
99 Unrecoverable hardware failure. Service or replace your module.
E2 RAM Test Failure Service or replace your module.
E4 Lost power during FLASH upgrade Service or replace your module.
E5 No application code Service or replace your module.
E9 Module memory has been flushed for factory
default settings. Cycle module power to recover.
SLC DeviceNet Scanner — 1747-SDN
Attribute Value
Module location SLC 5/02 or later chassis
Module defaults Node Address – 63
Baud Rate – 125 Kbps
Power consumption
- Backplane current
- DeviceNet
5V DC, 500 mA
24V DC, 90 mA Class 2
Isolation voltage 30V (continuous), Basic Insulation Type
Tested at 500V AC for 60 s, DeviceNet to backplane
Temperature, operating IEC 60068-2-1 (Test Ad, Operating Cold),
IEC 60068-2-2 (Test Bd, Operating Dry Heat),
IEC 60068-2-14 (Test Nb, Operating Thermal Shock):
0…60
o
C (32…140
o
F)
Temperature, non-operating IEC 60068-2-1 (Test Ab, Unpackaged Nonoperating Cold),
IEC 60068-2-2 (Test Bc, Unpackaged Nonoperating Dry Heat),
IEC 60068-2-14 (Test Na, Unpackaged Nonoperating Thermal Shock):
-40…85
o
C (-40…185
o
F)
Relative humidity IEC 60068-2-30 (Test Db, Unpackaged Damp Heat):
5…95% non-condensing
Vibration IEC60068-2-6 (Test Fc, Operating):
2 g @10…500 Hz
Shock IEC60068-2-27:1987, Test Ea (Unpackaged shock, ES#002)
Operating — 30 g
Non-operating — 50 g
Numeric
Code Description Corrective Action