Allied Telesis AT-2900 Series Adapters - Manual (Page 122)

Chapter 11: DOS Diagnostics
122
Diagnostic Tests
The tests are divided into four groups: Register Tests, Memory Tests,
Miscellaneous Tests, and Data Tests. They are named group ‘A’, ‘B’, ‘C’,
and ‘D’.
Test Names
This section lists the groups and the names of the diagnostics tests.
Group A.
A1. Indirect Register Test
A2. Control Register Test
A3. Interrupt Test
A4. BIST
A5. PCI Cfg Register Test
Group B.
B1. Scratch Pad Test
B2. BD SRAM Test
B3. DMA SRAM Test
B4. MBUF SRAM Test
B5. MBUF SRAM via DMA Test
B6. External SRAM Test
Group C.
C1. EEPROM Test
C2. CPU Test
C3. DMA Test
C4. MII Test
C5. VPD Test
C6. ASF Test
C7. ROM Expansion Test
Group D.
D1. Mac Loopback Test
D2. Phy Loopback Test
D3. RJ45 Loopback Test
D4. MII Miscellaneous Test
D5. MSI Test
Test Descriptions
This section provides descriptions of the diagnostic tests.
A1. Indirect Register Test
Function: Using indirect addressing method, writing increment data into