MagTek InSpec 9000-2005 - Manual (Page 70)

InSpec 9000-2005 Encoded Card Tester
60
Parameter ISO Unused Returned
Term Card Limit Card Limit
Signal Amplitude*
Ui 126%
≥ Ui ≥ 64%
126%
≥ Ui ≥ 52%
Average Bit Density Ba ± 5% ± 8%
Flux Transition Spacing Variation Bin ± 7% ± 15%
Subinterval Spacing Variation Sin ± 10% ± 20%
Adjacent Bit Cell Variation Bin+1 ± 10% ± 15%
Adjacent Subinterval Variation Sin+1 ± 12% ± 30%
Start Sentinel Position
0.293" ± 0.020" (7.44 ± 0.50 mm)
TRACK 3
Parameter
ISO Unused Returned
Term Card Limit Card Limit
Signal Amplitude*
Ui 126%
≥ Ui ≥ 64%
126%
≥Ui ≥ 52%
Average Bit Density Ba ± 8% ± 8%
Flux Transition Spacing Variation Bin ± 10% ± 15%
Subinterval Spacing Variation Sin ± 12% ± 20%
Adjacent Bit Cell Variation Bin+1 ± 10% ± 15%
Adjacent Subinterval Variation Sin+1 ± 12% ± 30%
Start Sentinel Position
0.293" ± 0.039" (7.44 ± 1.00 mm)
* as a percent of Reference Signal Amplitude
It should be noted that there are no unused and returned card specifications for Start Sentinel.
The ISO specifications for start sentinel are used as unused limits. The returned card limits were
calculated to ensure that there would be enough zero bits on each end of the card for most read
circuitry to synchronize before the first one bit.