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Atec Tektronix-TDS7154 User Manual

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Digital Phosphor Oscilloscopes

TDS7000 Series

Clock Recovery

Option SM on the TDS7154, TDS7254

and TDS7404 includes clock recovery for

electrical serial data streams from 1.5 Mbaud

to 2.5 Gbaud. Users can easily and reliably

perform mask testing and parametric analysis

with a single connection.

Communications
Measurements

Option SM adds a broad suite of eye-pattern

related measurements that are fundamental

for analysis of serial communications signals,

including eye width, eye height, jitter, noise

and extinction ratio. These are built on the

waveform database acquisition mode which

provides information over a much larger sample

of data, ensuring stable and accurate results.

Serial Pattern Trigger

Option ST (serial trigger) available on the

TDS7154, TDS7254 and TDS7404 models

provides hardware-based serial pattern

trigger. This option provides a direct means

to discriminate patterns within serial data

streams and analyze pattern dependent

issues, even on a single-shot basis. Users can

specify patterns with up to 32 bits, including

“don’t care” bits. The serial trigger system can

be clocked from an external source or internal

clock recovery can be applied, providing single

connection convenience.

External Timebase Reference

The reference oscillator in TDS7154, TDS7254

and TDS7404 models can be phase-locked

to an external 10 MHz source to match stabili-

ty or synchronize multiple instruments. This

phase-lock technique can also enable charac-

terization of very low frequency wander and

modulation effects.

Application-specific
Extensions

Applied measurement extensions can be

installed to enhance TDS7000 capabilities.

These software applications build on the pre-

cision acquisition performance of TDS7000

Series to address the need for application

specific measurements to quickly quantify

device and system performance. Optional

applications include:

Jitter analysis for high speed clock and data
signal characterization

Compliance testing for signaling defined
in ITU-T G.703 and ANSI T1.102
communications standards

Compliance testing for signaling defined in
USB1.0 standard and USB2.0 draft standard

Disk drive read channel, head and media
measurements to IDEMA standards;
PRML measurements

VocalLink™ voice control software for
TDS7000 Series oscilloscopes

Application-specific
Extensions

The TDS7000 family contains many extended

features to quantify and document signal

characteristics. These features remain close

at hand without cluttering the human inter-

face. Applied measurement extensions can

be installed to enhance TDS7000 capabilities.

Optional applications include jitter analysis

(TDSJIT2) and disk drive measurements

(TDSDDM2). These applications build on

the precision signal acquisition performance

of the TDS7000 Series to address the need

for application-specific measurements to

quickly quantify device performance.

Intuitive Zooming

TDS7000 acquired waveforms are always

horizontally fit into the display. This “big

picture” is retained for context while zoom

is used to select areas of specific interest.

Waveform zoom can be directly controlled

with knobs or the graphical user interface

for intuitive interaction.

Parametric Measurements

The TDS7000 includes a complete parametric

measurement system for signal characteriza-

tion. Direct selection from a graphical palette

makes locating choices simple. Users can

quickly reassign measurements to a different

waveform, simplifying verification tasks. Split

cursors make it easy to measure trace-to-

trace timing characteristics. Measurement

statistics can be gathered for deeper insight.

Measurement results are easily extracted for

inclusion in a document or analysis in a

spreadsheet using the Microsoft Windows

clipboard or an Export function.

Powerful Math

The TDS7000 Series allows user defined

math expressions to be performed on wave-

form data giving them the opportunity to

get on-screen results in terms that they can

define. Common waveform math functions

are provided at the touch of a button. For

advanced applications, algebraic expressions

consisting of waveform sources, math func-

tions, measurement values and scalars can

be created easily using a calculator-style

editor. This allows users to quickly transform

raw waveform data into powerful information

that is readily interpreted.

Digital Phosphor Oscilloscopes •

www.tektronix.com/tds7000

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