Atec Panametrics-Olympus-Epoch-XT - Manual (Page 5)

5
Template Storage
API 5UE
Interface Gate
Template Storage
allows on-screen comparison of a live waveform with a saved
reference waveform. saved templates can be dynamically toggled
on and off with a single key press for fast waveform comparison.
Gain adjustment feature allows each saved template a unique
base gain for inspections requiring varying sensitivity levels. ex-
cellent for spotweld analysis and other applications.
A dvanced Filters
the advanced Filters option takes advantage of the ePocH Xt’s
unique digital receiver design and allows unprecedented filtering
flexibility. this option allows the ePocH Xt operator to choose
from 37 different filter settings. specific performance improvements
from this option include:
• Performance im provement with low- frequency probes com-
monly used for inspection of composites and plastics.
• Improved initial pulse recovery with new DC coupled setups.
•
optimized broadband response from mid- to high-frequency
transducers.
• Use of very low frequency transducers (50 kHz to 100 kHz
range) for specialized applications.
Interface Gate
this optional third measurement gate enables real-time tracking
of a variable interface echo in order to maintain consistent digital
measurements.
Backwall Echo Attenuator (BEA)
attenuates the backwall echo of an inspected part using the
screen region defined by Gate 2. Bea is used to avoid screen sat-
uration of the backwall echo to allow detailed flaw echo examina-
tion in the part region before the backwall while still monitoring
the backwall echo for drop-out or signal reduction.
API 5UE
allows defect sizing according to aPi recommended Practice
5Ue. Uses the amplitude Distance Differential technique (aDDt)
to measure the size of potential defects during the proveup
process of octG pipe. the measurement process is simple and
repeatable since all aDDt variables are captured from a Peak
Memory envelope.