Atec Agilent-N3300A - Manual (Page 2)

2
Increase Test Throughput
Today’s high volume manufacturing
requires optimization of test system
throughput, to maximize production
volume without increasing floorspace.
The N3300 Series electronic loads
can help you in a number of ways to
achieve this goal.
Reduced command processing time:
Commands are processed more
than 10 times faster than previous
electronic loads.
Automatically execute stored
command sequences:
“Lists” of
downloaded command sequences can
execute independent of the computer,
greatly reducing the electronic load
command processing time and com-
puter interaction time during product
testing.
Programmable delay allows for
either simultaneous or sequential
load changes:
This is the most
multiple output DC power supplies,
simulating real-life loading patterns,
with a minimum of programming
commands.
Buffer measurement data: Voltage,
current, and power measurements
can be buffered for later readback
to the computer, reducing computer
interaction.
Control measurement speed vs.
accuracy:
Decrease the number of
measurement samples to achieve
greater measurement speed, or
increase the number of samples to
achieve higher measurement accu-
racy. You can optimize your measure-
ments for each test.
Control rising and falling slew rates
separately:
Reduce rate of loading
change when necessary for DUT
stability or to simulate real life condi-
tions, but otherwise change load
values at maximum rate.
Standard DC connectors
Option UJ1 8 mm screw connectors
Increase System
Flexibility…for Both
Present and Future
Requirements
Most power supply and battery
charger test systems designed today
need to test a variety of products
and/or assemblies. In the future,
additional products or assemblies
may be needed. A flexible family
of electronic loads makes present
system design and future growth
much easier.
Test low voltage power supplies:
The N3300 Series electronic loads
operate with full stability down to
zero volts. Many other electronic
loads available today have been found
to become unstable in the operating
region below one volt. When design-
ing power supply test platforms, the
trend towards lower voltage require-
ments should be taken into account.
Refer to the specification and
supplemental characteristic tables
for details of lower voltage operating
characteristics.
Choose DC load connection method:
Automatic test systems need
consistency and reliability. Option
UJ1 8 mm screw connectors provide
a simple screw onto which your
wires, terminated with insulated ring
terminals, may be securely mounted.
This optional connector is specifically
designed for test systems. Wires may
exit the plastic cover in any direction,
and multiple wires may be placed on
each screw terminal for easy parallel
load connections. Up to AWG 4 wire
may be used.
Applications which require repeated
connections/disconnections are bet-
ter suited to the standard connector.
The standard connector accepts an
unterminated wire, and may be hand-
tightened. This connector is specifi-
cally designed for bench applications
and short-term automated tests.
Design a system to test a variety
of products:
This series consists of
2 mainframes and 6 modules. The
N3300A mainframe is full rack width.
It has 6 slots. The N3301A mainframe
is half rack width. It has 2 slots.
Any assortment of the 6 different
modules can be configured into these
mainframes, up to the slot capacity.
The N3302A (150 watts), N3303A
(250 watts), N3307A (250 Watts) and
N3304A (300 watts) each require
one slot. The N3305A (500 watts)
and the N3306A (600 watts) each
require 2 slots. The electronic load
can be configured to supply exactly
what you need now, and this modular
design also allows for easy future
reconfiguration.
Test high current power supplies:
Electronic load modules can be oper-
ated in parallel to provide additional
current sinking capability.