Electrical fast transients – Atec EM-Test-UCS500N Series User Manual

Page 4

DATA SHEET > UCS 500N5 > 20131118

TECHNICAL DETAILS

ELECTRICAL FAST TRANSIENTS

BURST MODULE, EFT/N5

As per EN/IEC 61000-4-4 and
EN 61000-6-1, -6-2

Test voltage

200V - 5,500V ± 10%;
100V - 2,750V ± 10% into 50ohm

Pulse shape

5/50ns into 50ohm and 1,000ohm

Rise time tr

5ns ± 30% into 50ohm;
5ns ± 30% into 1,000ohm

Pulse width td

50ns ± 30% into 50ohm;
50ns -15/+100ns into 1,000ohm

Source impedance

50ohm

Polarity

Positive/negative

TRIGGER CIRCUIT

Trigger of bursts

Automatic, manual, external

Synchronization

0° - 360°, resolution 1° (16 - 500Hz)

Burst duration

td = 0.10ms - 999ms

Repetition rate

tr = 10ms - 9,999ms

Spike frequency

f = 0.1kHz - 1,000kHz

Test duration

T = 0:01min - 99:59min
T > 99:59min --> endless

OUTPUTS

Direct

Via 50ohm coaxial connector

Coupling mode

L, N, PE; all combinations

DUT supply

AC: 300V/16A; 50/60Hz
DC: 300V/16A

CRO trigger

5V trigger signal for oscilloscope

TEST ROUTINES

Quick Start

On-line adjustable parameters,
easy-to-use

Standard Test
routines

As per IEC 61000-4-4, Levels 1 - 4
As per EN 61000-6-1, -6-2
Manual Standard Test routine

User Test routines

Synchronous burst release
Random burst release
Change voltage after T
Frequency sweep within one burst
Frequency sweep with constant
number of pulses
Frequency sweep with constant
burst duration
Change polarity after T

OPTIONS

HFK

Capacitive coupling clamp as per
IEC 61000-4-4

KW50

100:1 divider, 50ohm

KW1000

500:1 divider, 1,000ohm

CA EFT kit

Kit for burst pulse verification
consisting of KW50, KW1000 and
adapter for DUT port in a plastic case
for storage

A6dB

6dB attenuator, 50ohm

ITP

Immunity test probes (electrical field
generation)

ITP/H

Immunity test probe (magnetic field
generation)