Rainbow Electronics ATA6670 - Manual (Page 12)

12
9204C–AUTO–09/11
Atmel ATA6670 [Preliminary]
6. Electrical Characteristics
5V < V
S
< 27V, T
j
= –40°C to +150°C; the values below are valid for each of the two nearly identical integrated LIN transceivers unless
otherwise specified.
No. Parameters Test Conditions Pin Symbol Min. Typ. Max. Unit Type*
1 V
S
Pin
1.1 DC voltage range nominal VS V
S
5 13.5 27 V A
1.2 Supply current in sleep mode
Sleep mode
V
LIN
> V
S
– 0.5V
V
S
< 14V
VS I
VSsleep
10 20 µA A
Sleep mode,
bus shorted to GND
V
LIN
= 0V
V
S
< 14V
VS I
VSsleep_sc
23 45 µA A
1.3
Supply current in normal mode
Bus recessive
V
S
< 14V
VS I
VSrec
0.9 1.3 mA A
1.4
Bus dominant
V
S
< 14V
Total bus load > 500
Ω
VS I
VSdom
1.2 2 mA A
1.5 Supply current in fail-safe mode
Bus recessive
V
S
< 14V
VS I
VSfail
0.5 1.1 mA A
1.6 V
S
undervoltage threshold on VS V
Sth
4 4.95 V A
1.7 V
S
undervoltage threshold off VS V
Sth
4.05 5 V A
1.8
V
S
undervoltage threshold
hysteresis
VS V
Sth_hys
50 500 mV A
2 RXD Output Pin (Open Drain)
2.1 Low-level output sink current
Normal mode
V
LIN
= 0V, V
RXD
= 0.4V
RXD I
RXDL
1.3 2.5 8 mA A
2.2 RXD saturation voltage 5-k
Ω
pull-up resistor to 5V RXD Vsat
RXD
0.4 V A
2.3 High-level leakage current
Normal mode
V
LIN
= V
BAT
, V
RXD
= 5V
RXD I
RXDH
–3 +3 µA A
2.4 ESD Zener diode I
RXD
= 100µA RXD VZ
RXD
5.8 8.6 V A
3 TXD Input/Output Pin
3.1 Low-level voltage input TXD V
TXDL
–0.3 +0.8 V A
3.2 High-level voltage input TXD V
TXDH
2 7 V A
3.3 Pull-down resistor V
TXD
= 5V TXD R
TXD
125 250 600 k
Ω
A
3.4 Low-level leakage current V
TXD
= 0V TXD I
TXD_leak
–3 +3 µA A
3.5
Low-level output sink current
(only available at transceiver 2)
Transceiver 2: fail-safe mode,
local wake-up
V
TXD2
= 0.4V
V
LIN2
= V
BAT
TXD2 I
TXD2
1.3 2.5 8 mA A
4 EN Input Pin
4.1 Low-level voltage input EN V
ENL
–0.3 +0.8 V A
4.2 High-level voltage input EN V
ENH
2 7 V A
4.3 Pull-down resistor V
EN
= 5V EN R
EN
125 250 600 k
Ω
A
4.4 Low-level input current V
EN
= 0V EN I
EN
–3 +3 µA A
*) Type means: A = 100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter