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Step immunity and no r, Sense, Appendix a – Rainbow Electronics MAX5937 User Manual

Page 17

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MAX5936/MAX5937

-48V Hot-Swap Controllers with V

IN

Step Immunity and No R

SENSE

______________________________________________________________________________________

17

load-probe, and V

EE

. Because of the nature of the hot-

swap requirement, no decoupling capacitor is recom-
mended for the MAX5936/MAX5937. Because there is
no decoupling capacitor, stray inductance can result in
excessive ringing at the GND pin during power-up or
during very rapid V

IN

steps. This should be examined

in every application design since ringing at the GND
pin may exceed the absolute maximum supply rating
for the part.

Input Transient Protection

During hot plug-in/unplug and fast V

IN

steps, stray

inductance in the power path can cause voltage ring-
ing above the normal input DC value, which may
exceed the absolute maximum supply rating. An input
transient such as that caused by lightning can also put
a severe transient peak voltage on the input rail. The
following techniques are recommended to reduce the
effect of transients:

1) Minimize stray inductance in the power path using

wide traces and minimize loop area including the
power traces and the return ground path.

2) Add a high-frequency (ceramic) bypass capacitor

on the backplane as close as possible to the plug-
in connector (Figure 17).

3) Add a 1kΩ resistor in series with the MAX5936/

MAX5937’s GND pin and a 0.1µF capacitor from
GND to V

EE

to limit transient current going into this pin.

Appendix A

GATE Cycles

The power-up GATE cycle and the step GATE cycle are
quite similar but have distinct differences. Understanding
these differences may clarify application issues.

GATE Cycle During Power-Up

The power-up GATE cycle occurs during the initial
power-up of the MAX5936/MAX5937 and the associat-
ed power MOSFET and load. The power-up GATE
cycle can result in full enhancement or in a fault (all
voltages are relative to V

EE

).

Power-Up to Full Enhancement:

1) At the beginning of the power-up sequence to the

start of the power-up GATE cycle, the GATE is held
at V

EE

. Following a successful completion of the

load-probe test, GATE is held at V

EE

for an addi-

tional 350µs and then is allowed to float for 650µs.
At this point, the GATE begins to ramp with 52µA
charging the gate of the power MOSFET. [GATE
turn-on]

2) When GATE reaches the gate threshold voltage of

the power MOSFET, V

OUT

begins to ramp down

toward V

EE

. [V

OUT

ramp]

3) When V

OUT

ramps below 72% V

CB

, the GATE is

rapidly pulled to full enhancement and the power-
up GATE cycle is complete. 1.26ms after GATE is
pulled to full enhancement, PGOOD will assert. [Full
enhancement]

Figure 15. MAX5936/MAX5937 Slew Rate vs. C

SLEW

SLEW RATE vs. C

SLEW

C

SLEW

(nF)

SLEW RATE (V/ms)

100

10

1

0.1

1

10

0.01

0.1

1000

Figure 16. Adjusting the MAX5936/MAX5937 Slew Rate

MAX5936
MAX5937

V

OUT

C

LOAD

LOAD

GATE

V

EE

GND

C

SLEW

R

GATE

-48V

GND