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Step immunity and no r, Sense, Pgood – Rainbow Electronics MAX5937 User Manual

Page 12

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MAX5936/MAX5937

-48V Hot-Swap Controllers with V

IN

Step Immunity and No R

SENSE

12

______________________________________________________________________________________

PGOOD (

PGOOD

) Open-Drain Output

The power-good outputs, PGOOD (PGOOD), are open
drain and are referenced to V

OUT

. They assert and latch

if V

OUT

ramps below 72% of V

CB

, and with the built-in

delay this occurs 1.26ms after the external MOSFET
becomes fully enhanced. PGOOD (PGOOD) deasserts
any time the part enters fault management. PGOOD
(PGOOD) has a delayed response to UVLO. The GATE
goes to V

EE

when UVLO is brought below 1.125V for

1.5ms. This turns off the power MOSFET and allows
V

OUT

to rise depending on the RC time constant of the

load. PGOOD (PGOOD), in this situation, deasserts
when V

OUT

rises above V

CB

for more than 1.4ms or

above V

SC

, whichever occurs first (see Figure 12b).

Due to the open-drain driver, PGOOD (PGOOD)
requires an external pullup resistor to GND. Due to this
external pullup, PGOOD will not follow positive V

IN

steps as well as if it were driven by an active pullup. As
a result, when PGOOD (PGOOD) is asserted high, an
apparent negative glitch appears at PGOOD (PGOOD)
during a positive V

IN

step. This negative glitch is a

result of the RC time constant of the external resistor
and the PGOOD pin capacitance lagging the V

IN

step.

It is not due to switching of the internal logic. To mini-
mize this negative transient, it may be necessary to
increase the pullup current and/or to add a small
amount of capacitance from PGOOD (PGOOD) to GND
to compensate for the pin capacitance.

WARNING:

For the MAX5936_N/MAX5937_N, PGOOD

(PGOOD) asserts 1.26ms after the power MOSFET is fully
enhanced, independent of V

OUT

. Once the MOSFET is

fully enhanced and UVLO is pulled below its respective
threshold, GATE pulls to V

EE

to turn off the power

MOSFET and disconnect the load. When UVLO is
cycled low, PGOOD (PGOOD) remains asserted even
when V

OUT

has risen to GND and there is no voltage

across the load. In summary, once the MOSFET is fully
enhanced, the MAX5936_N/ MAX5937_N ignore V

OUT

and deassert PGOOD (PGOOD) only when the power
to the MAX5936_N/ MAX5937_N is fully recycled.

Undervoltage Lockout (UVLO)

UVLO provides an accurate means to set the turn-on volt-
age level for the MAX5936/MAX5937. Use a resistor-
divider network from GND to V

EE

to set the desired

turn-on voltage (Figure 11). UVLO has hysteresis with a
rising threshold of 1.25V and a falling threshold of 1.125V.
A startup delay of 220ms allows contacts and voltages to
settle prior to initiating the startup sequence (Figure 12a).

Figure 9. MAX5936/MAX5937 Normalized Circuit-Breaker
Threshold (V

CB

)

NORMALIZED MOSFET ON-RESISTANCE

vs. TEMPERATURE

TEMPERATURE (°C)

NORMALIZED MOSFET ON-RESISTANCE

60

35

10

-15

0.6

0.8

1.0

1.2

1.4

1.6

0.4

-40

85

IRF1310NS
NORMALIZED R

ON

IRFR3910
NORMALIZED R

ON

MAX5936/MAX5937
NORMALIZED V

CB

Figure 10. Circuit-Breaker Voltage Margin for High and Low Tempco Power MOSFETS

CIRCUIT-BREAKER
TRIP REGION

CIRCUIT-BREAKER
TRIP REGION

T

A

= +25°C

T

A

= +25°C

V

CB

I

D

x R

DS,ON

∆V

CB,MIN

∆V

CB,MIN

V

CB

I

D

x R

DS,ON

R

DS(ON)

HIGH TEMPCO

R

DS(ON)

LOW TEMPCO

VOL

TAGE

TEMPERATURE

TEMPERATURE

VOL

TAGE