Hitachi HUS157336EL3600 - Manual (Page 26)

Drawing No. Sheet No. Revision 5
K6602906 26/46 2003/6/12
7.4 Precautions on the off-line test or bench test
When the off-line test or bench test is performed the drive should be tightly fixed
and cooled. The set-up should be similar to the actual system configuration.
7.5 Cooling of the drive
Keep the drive (HDA and PCB) cool by using a FAN. Reliability and life of the drive
increases as the temperature is lower.
7.6 Reliability temperature
The temperature measurement points and temperature limits are shown below.
1. The maximum temperature assures the data reliability, seek error rate, and must not
be exceeded.
2. The reliability temperature maintains the MTBF of the drive and must not be
exceeded in order to ensure its reliability. MTBF is also based on a nominal voltage
condition.
3. The maximum temperature of HDA includes momentary temperature rise. Average
temperature of HDA has to be less than this temperature.
Table 7.1 Temperature Limits (unit: °C)
Measurement points HDA(top) HDA(bottom) IC(RW) IC(MPU)
Maximum temperature 65 65 85 85
Reliability temperature 50 50 70 70
HDA(top) IC(RW) HDA(bottom)
Breathing hole IC(MPU)
Figure 7.4 Temperature Measurement Points
Caution