Capacitance, Thermal resistance, Ac test loads and waveforms – Cypress CY7C1217H User Manual
Page 9
CY7C1217H
Document #: 38-05670 Rev. *B
Page 9 of 16
Capacitance
[9]
Parameter
Description
Test Conditions
100 TQFP
Max.
Unit
C
IN
Input Capacitance
T
A
= 25
°C, f = 1 MHz,
V
DD
= 3.3V. V
DDQ
= 2.5V
5
pF
C
CLK
Clock Input Capacitance
5
pF
C
I/O
Input/Output Capacitance
5
pF
Thermal Resistance
[9]
Parameter
Description
Test Conditions
100 TQFP
Package
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, per EIA/JESD51
30.32
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
6.85
°C/W
AC Test Loads and Waveforms
Note:
9. Tested initially and after any design or process change that may affect these parameters.
OUTPUT
R = 317
Ω
R = 351
Ω
5 pF
INCLUDING
JIG AND
SCOPE
(a)
(b)
OUTPUT
R
L
= 50
Ω
Z
0
= 50
Ω
V
T
= 1.5V
3.3V
ALL INPUT PULSES
V
DDQ
GND
90%
10%
90%
10%
≤ 1 ns
≤ 1 ns
(c)
OUTPUT
R = 1667
Ω
R =1538
Ω
5 pF
INCLUDING
JIG AND
SCOPE
(a)
(b)
OUTPUT
R
L
= 50
Ω
Z
0
= 50
Ω
V
T
= 1.25V
2.5V
ALL INPUT PULSES
V
DDQ
GND
90%
10%
90%
10%
≤ 1 ns
≤
1 ns
(c)
3.3V I/O Test Load
2.5V I/O Test Load