Cypress CY7C1157V18 User Manual
Features, Configurations, Functional description
CY7C1146V18, CY7C1157V18
CY7C1148V18, CY7C1150V18
18-Mbit DDR-II+ SRAM 2-Word Burst
Architecture (2.0 Cycle Read Latency)
Cypress Semiconductor Corporation
•
198 Champion Court
•
San Jose
,
CA 95134-1709
•
408-943-2600
Document Number: 001-06621 Rev. *D
Revised March 06, 2008
Features
■
18 Mbit density (2M x 8, 2M x 9, 1M x 18, 512K x 36)
■
300 MHz to 375 MHz clock for high bandwidth
■
2-Word burst for reducing address bus frequency
■
Double Data Rate (DDR) interfaces
(data transferred at 750 MHz) at 375 MHz
■
Read latency of 2.0 clock cycles
■
Two input clocks (K and K) for precise DDR timing
❐
SRAM uses rising edges only
■
Echo clocks (CQ and CQ) simplify data capture in high-speed
systems
■
Data valid pin (QVLD) to indicate valid data on the output
■
Synchronous internally self-timed writes
■
Core V
DD
= 1.8V ± 0.1V; IO V
DDQ
= 1.4V to V
DD
■
HSTL inputs and Variable drive HSTL output buffers
■
Available in 165-Ball FBGA package (13 x 15 x 1.4 mm)
■
Offered in both Pb-free and non Pb-free packages
■
JTAG 1149.1-compatible test access port
■
Delay Lock Loop (DLL) for accurate data placement
Configurations
With Read Cycle Latency of 2.0 cycles:
CY7C1146V18 – 2M x 8
CY7C1157V18 – 2M x 9
CY7C1148V18 – 1M x 18
CY7C1150V18 – 512K x 36
Functional Description
The CY7C1146V18, CY7C1157V18, CY7C1148V18, and
CY7C1150V18 are 1.8V Synchronous Pipelined SRAMs
equipped with DDR-II+ architecture. The DDR-II+ consists of an
SRAM core with advanced synchronous peripheral circuitry.
Addresses for read and write are latched on alternate rising
edges of the input (K) clock. Write data is registered on the rising
edges of both K and K. Read data is driven on the rising edges
of K and K. Each address location is associated with two 8-bit
words (CY7C1146V18) or 9-bit words (CY7C1157V18) or 18-bit
words (CY7C1148V18) or 36-bit words (CY7C1150V18) that
burst sequentially into or out of the device.
Asynchronous inputs include output impedance matching input
(ZQ). Synchronous data outputs (Q, sharing the same physical
pins as the data inputs D) are tightly matched to the two output
echo clocks CQ/CQ, eliminating the need for separately
capturing data from each individual DDR SRAM in the system
design.
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the K or K input clocks. Writes are
conducted with on-chip synchronous self-timed write circuitry.
Selection Guide
Description
375 MHz
333 MHz
300 MHz
Unit
Maximum Operating Frequency
375
333
300
MHz
Maximum Operating Current
1020
920
850
mA
Note
1. The QDR consortium specification for V
DDQ
is 1.5V + 0.1V. The Cypress QDR devices exceed the QDR consortium specification and are capable of supporting V
DDQ
= 1.4V to V
DD
.
Document Outline
- Features
- Configurations
- Functional Description
- Selection Guide
- Logic Block Diagram (CY7C1146V18)
- Logic Block Diagram (CY7C1157V18)
- Logic Block Diagram (CY7C1148V18)
- Logic Block Diagram (CY7C1150V18)
- Pin Configurations
- Pin Definitions
- Functional Overview
- Truth Table
- Write Cycle Descriptions
- IEEE 1149.1 Serial Boundary Scan (JTAG)
- TAP Controller State Diagram
- TAP Controller Block Diagram
- TAP Electrical Characteristics
- TAP AC Switching Characteristics
- TAP Timing and Test Condition
- Identification Register Definitions
- Scan Register Sizes
- Instruction Codes
- Boundary Scan Order
- Power Up Sequence in DDR-II+ SRAM
- Power Up Sequence
- DLL Constraints
- Power Up Waveforms
- Maximum Ratings
- Operating Range
- Electrical Characteristics
- AC Input Requirements
- Capacitance
- Thermal Resistance
- AC Test Loads and Waveforms
- Switching Characteristics
- Switching Waveforms
- Ordering Information
- Package Diagram
- Document History Page