Capacitance, Thermal resistance, Ac test loads and waveforms – Cypress CY7C1386D User Manual
Page 19
CY7C1386D, CY7C1386F
CY7C1387D, CY7C1387F
Document Number: 38-05545 Rev. *E
Page 19 of 30
Capacitance
Parameter
Description
Test Conditions
100 TQFP
Max.
119 BGA
Max
165 FBGA
Max
Unit
C
IN
Input Capacitance
T
A
= 25
°C, f = 1 MHz,
V
DD
= 3.3V
V
DDQ
= 2.5V
5
8
9
pF
C
CLK
Clock Input Capacitance
5
8
9
pF
C
IO
Input/Output Capacitance
5
8
9
pF
Thermal Resistance
Parameter
Description
Test Conditions
100 TQFP
Package
119 BGA
Package
165 FBGA
Package
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow standard
test methods and procedures
for measuring thermal
impedance, in accordance with
EIA/JESD51.
28.66
23.8
20.7
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
4.08
6.2
4.0
°C/W
AC Test Loads and Waveforms
OUTPUT
R = 317
Ω
R = 351
Ω
5 pF
INCLUDING
JIG AND
SCOPE
(a)
(b)
OUTPUT
R
L
= 50
Ω
Z
0
= 50
Ω
V
T
= 1.5V
3.3V
ALL INPUT PULSES
V
DDQ
GND
90%
10%
90%
10%
≤ 1 ns
≤ 1 ns
(c)
OUTPUT
R = 1667
Ω
R = 1538
Ω
5 pF
INCLUDING
JIG AND
SCOPE
(a)
(b)
OUTPUT
R
L
= 50
Ω
Z
0
= 50
Ω
V
T
= 1.25V
2.5V
ALL INPUT PULSES
V
DDQ
GND
90%
10%
90%
10%
≤ 1 ns
≤ 1 ns
(c)
3.3V IO Test Load
2.5V IO Test Load
Note
19. Tested initially and after any design or process change that may affect these parameters.