Metrohm NIRS XDS Process Analyzer – MicroBundle - Manual (Page 70)

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In Instrument Calibration, the XDS instrument is set to nominals which provide excellent instrument
transfer, and which meet published NIST wavelengths when tested in Wavelength Certification. Peaks
for the additional ingredient are set to peak nominals determined by measurement on several
different types of research instrumentation.
In Wavelength Certification, the NIST-stated uncertainty of 1.0nm is applied. Tighter tolerances are
not appropriate, unless NIST revises the stated uncertainty of SRM-1920a at some point in the future.
10.2.4 Performance Test, Interactance Reflectance
1. Select Performance Test from the
Diagnostics menu bar.
2. Select the channel to be used for the test.
In this case, we select “SAMPLE”. The 99%
Certified Reflectance Standard must be on
the probe for this test.
This tests the sample channel, and provides
a comprehensive test of instrument
performance.