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Terms and definitions – KROHNE TT 51 SERIES EN User Manual

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TERMS AND DEFINITIONS

2

5

TT 51 SERIES

www.krohne.com

09/2010 - 4000869801 - AD TT 51 SIL R01 en

Terms and definitions

Used abbreviations

DC

D

Diagnostic Coverage of dangerous failures.

Diagnostic coverage is the ratio of the detected failure rate to the total failure rate.

FIT

Failure In Time (1x10

-9

failures per hour)

FMEA

Failure Modes Effects Analysis is a structured qualitative analysis of a system,

subsystem, process, design or function to identify potential failure modes, their

causes and their effects on (system) operation.

FMEDA

Failure Modes Effects and Diagnostic Analysis adds a qualitative failure data for all

components being analyzed and ability of the system to detect internal failures via

automatic on-line diagnostics parts to FMEA.

HFT

Hardware Fault Tolerance

Low demand mode Mode, where the frequency of demand for operation made on a safety-related

system is not greater than one per year and not greater than twice the proof-test

frequency.

High demand

mode

Mode, where the frequency of demands for operation made on a safety-related

system is greater than one per year and greater than twice the proof-check

frequency.

MTBF

Mean Time Between Failure is average time between failure occurrences.

MTTR

Mean Time To Restoration is average time needed to restore normal operation after

a failure has occurred.

PFD

AVG

Probability of Failure on Demand is the average probability of a system to fail to

perform its design function on demand.

PFH

Probability of Failure per Hour is the probability of a system to have a dangerous

failure occur per hour.

SFF

Safe Failure Fraction summarizes the fraction of failure, which lead to a safe state

and the fraction of failures which will be detected by diagnostic measures and lead

to a defined safety action.

SIF

Safety Instrumented Function

SIL

Safety Integrity Level

Type A component

"Non-complex" subsystem (all failure modes are well defined);

for details see 7.4.3.1.2 of IEC 61508-2.

Type B component

"Complex" subsystem (at least one failure mode are not well defined);

for details see 7.4.3.1.3 of IEC 61508-2.

T[Proof]

Proof Test Interval

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