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Extensive automated test capability, Carrier-to-noise measurement: in-service, Hum measurement: in-service – Atec Wavetek-SDA-5000-5500-5510 User Manual

Page 6: Modulation measurement, Local amplifier alignment w/loopback tests

Extensive automated test capability, Carrier-to-noise measurement: in-service, Hum measurement: in-service | Modulation measurement, Local amplifier alignment w/loopback tests | Atec Wavetek-SDA-5000-5500-5510 User Manual | Page 6 / 12 Extensive automated test capability, Carrier-to-noise measurement: in-service, Hum measurement: in-service | Modulation measurement, Local amplifier alignment w/loopback tests | Atec Wavetek-SDA-5000-5500-5510 User Manual | Page 6 / 12