The smart 4 kv solution for ce applications, Nsg 3040 – Atec Teseq-Schaffner-NSG3040 User Manual
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A d v a n c e d Te s t S o l u t i o n s f o r E M C
THE SMART 4 KV SOLUTION FOR CE APPLICATIONS
NSG 3040
Dips & drops
conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
Parameter
Value
Dips & drops:
From EUT voltage input to 0 V, 0%
Uvar with optional variac:
depending on model (VAR 650x)
Uvar with step transformer:
0, 40, 70, 80% (INA 650x)
Peak inrush current capability:
500 A (at 230 V)
Switching times:
1 to 5 μs (100 Ω load)
Event time:
20 µs to 1999 s, 1 to 99’999 cycles
Test duration:
1 s to 70’000 min, 1 to 99’999 events, continuous
Repetition time:
40 µs to 35 min, 1 to 99’999 cycles
Phase synchronization:
asynchronous, synchronous 0 to 359º (in 1º steps)
Variation test (with VAR 65xx only)
conforms to IEC/EN 61000-4-11
Parameter
Value
Uvar with optional variac:
0 to 265 V (in 1 V steps), 0 to 115% (in 1% steps)
Repetition time:
1 ms to 35 min, 1 to 99’999 cycles
Test duration:
1 ms to 5 s, 1 to 250 cycles (50 Hz);
1 to 300 cycles (60 Hz), abrupt
Repetition time:
10 ms to 10 s, 1 to 250 cycles (50 Hz), 1 to 300 cycles (60 Hz)
Test duration:
1 s to 99’999 min, 1 to 99’999 events, continuous
Phase synchronization:
asynchronous, synchronous 0 to 359º (in 1º steps)
Pulsed magnetic field in conjunction with INA 753 and INA 701 or 702
conforms to IEC/EN 61000-4-9
Parameter
Value
Field:
1 to 1200 A/m (in 1 A/m steps)
Polarity:
positive / negative / alternate
Repetition time:
5 s to 10 min (in 1 s steps)
Impedance:
2 Ω
Coil factor
0.01 to 50.00
Test duration:
1 to 9’999 pulses, continuous
Phase synchronization:
asynchronous, synchronous 0 to 359º (in 1º steps)