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The smart 4 kv solution for ce applications, Nsg 3040 – Atec Teseq-Schaffner-NSG3040 User Manual

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A d v a n c e d Te s t S o l u t i o n s f o r E M C

THE SMART 4 KV SOLUTION FOR CE APPLICATIONS

NSG 3040

Dips & drops
conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29

Parameter

Value

Dips & drops:

From EUT voltage input to 0 V, 0%

Uvar with optional variac:

depending on model (VAR 650x)

Uvar with step transformer:

0, 40, 70, 80% (INA 650x)

Peak inrush current capability:

500 A (at 230 V)

Switching times:

1 to 5 μs (100 Ω load)

Event time:

20 µs to 1999 s, 1 to 99’999 cycles

Test duration:

1 s to 70’000 min, 1 to 99’999 events, continuous

Repetition time:

40 µs to 35 min, 1 to 99’999 cycles

Phase synchronization:

asynchronous, synchronous 0 to 359º (in 1º steps)

Variation test (with VAR 65xx only)
conforms to IEC/EN 61000-4-11

Parameter

Value

Uvar with optional variac:

0 to 265 V (in 1 V steps), 0 to 115% (in 1% steps)

Repetition time:

1 ms to 35 min, 1 to 99’999 cycles

Test duration:

1 ms to 5 s, 1 to 250 cycles (50 Hz);

1 to 300 cycles (60 Hz), abrupt

Repetition time:

10 ms to 10 s, 1 to 250 cycles (50 Hz), 1 to 300 cycles (60 Hz)

Test duration:

1 s to 99’999 min, 1 to 99’999 events, continuous

Phase synchronization:

asynchronous, synchronous 0 to 359º (in 1º steps)

Pulsed magnetic field in conjunction with INA 753 and INA 701 or 702
conforms to IEC/EN 61000-4-9

Parameter

Value

Field:

1 to 1200 A/m (in 1 A/m steps)

Polarity:

positive / negative / alternate

Repetition time:

5 s to 10 min (in 1 s steps)

Impedance:

2 Ω

Coil factor

0.01 to 50.00

Test duration:

1 to 9’999 pulses, continuous

Phase synchronization:

asynchronous, synchronous 0 to 359º (in 1º steps)