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The smart 4 kv solution for ce applications, Nsg 3040 – Atec Teseq-Schaffner-NSG3040 User Manual

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A d v a n c e d Te s t S o l u t i o n s f o r E M C

Combination wave pulse 1, 2/50 - 8/20 µs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5

THE SMART 4 KV SOLUTION FOR CE APPLICATIONS

NSG 3040

The NSG 3040 performs tests according to the following specifi cations:

Parameter

Value

Pulse voltage (open circuit):

±200 V to 4.4 kV (in 1 V steps)

Pulse current (short circuit):

±100 A to 2.2 kA

Impedance:

2/12 Ω

Polarity:

positive / negative / alternate

Pulse repetition:

10 s, up to 600 s (in 1 s steps)

Test duration:

1 to 9999 pulses, continuous

Phase synchronization:

asynchronous, synchronous 0 to 359º (in 1º steps)

Coupling:

external / internal

Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4

Parameter

Value

Pulse amplitude:

±200 V to 4.8 kV (in 1 V steps) - open circuit

±100 V to 2.4 kV (50 Ω matching system)

Burst frequency:

100 Hz to 1000 kHz

Polarity:

positive / negative / alternate

Repetition time:

1 ms to 4200 s (70 min)

Burst time:

1 µs to 1999 s, single pulse, continuous

Test duration:

1 s to 1000 h

Phase synchronization:

asynchronous, synchronous 0 to 359º (in 1º steps)

Coupling:

external / internal