The smart 4 kv solution for ce applications, Nsg 3040 – Atec Teseq-Schaffner-NSG3040 User Manual
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A d v a n c e d Te s t S o l u t i o n s f o r E M C
Combination wave pulse 1, 2/50 - 8/20 µs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
THE SMART 4 KV SOLUTION FOR CE APPLICATIONS
NSG 3040
The NSG 3040 performs tests according to the following specifi cations:
Parameter
Value
Pulse voltage (open circuit):
±200 V to 4.4 kV (in 1 V steps)
Pulse current (short circuit):
±100 A to 2.2 kA
Impedance:
2/12 Ω
Polarity:
positive / negative / alternate
Pulse repetition:
10 s, up to 600 s (in 1 s steps)
Test duration:
1 to 9999 pulses, continuous
Phase synchronization:
asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling:
external / internal
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
Parameter
Value
Pulse amplitude:
±200 V to 4.8 kV (in 1 V steps) - open circuit
±100 V to 2.4 kV (50 Ω matching system)
Burst frequency:
100 Hz to 1000 kHz
Polarity:
positive / negative / alternate
Repetition time:
1 ms to 4200 s (70 min)
Burst time:
1 µs to 1999 s, single pulse, continuous
Test duration:
1 s to 1000 h
Phase synchronization:
asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling:
external / internal