Atec Tektronix-DTG5334 - Manual

Data Timing Generator
DTG5078 • DTG5274 • DTG5334 Data Sheet
Features & Benefits
Versatile Platform Combines Features of Data Generator, Pulse
Generator, and DC Source
Up to 3.35 Gb/s Data Rate
From 1 to 96 Data Channels (Master/Slave)
Class Leading Delay Resolution of 0.2 ps (DTG5274/DTG5334), 1 ps
(DTG5078), up to 600 ns of Total Delay
Modular Architecture Helps to Protect Your Investment and Allows the
Instrument to Expand With Your Growing Needs
Advanced Control Over Signal Parameters to Meet Most Current Testing
Needs, Including Stressed Eye Generation
External Jitter Injection (DTGM31, DTGM32 Modules)
Level Control with 5 mV Resolution
Easy to Use and Learn, Shortens Time to Test
Easily Configure with Plug-in Modules
Intuitive Windows User Interface
Benchtop Form Factor
Integrated PC Supports Network Integration and Built-in CD-ROM,
LAN, Floppy Drive, USB Ports
Up to 64 Mb Pattern Depth Per Channel for Complex Data Patterns
Applications
Semiconductor Device Functional Test and Characterization
Support for Semiconductor Technologies from TTL to LVDS
Initial Verification and Debugging, Comprehensive Characterization,
Manufacturing, and Quality Control
Compliance and Interoperability Testing to Emerging Standards
PCI-Express Gen1:2.5 Gbps
Serial ATA Gen1/2:1.5 Gbps/3 Gbps
InfiniBand 2.5 Gbps
XAUI: 3.125 Gbps
HDMI: Version 1.3 / DVI
Magnetic and Optical Storage Design
Research, Development, and Test of Next-generation Devices (HDD,
DC/DVD, Blu-ray)
Data Conversion Device Design
Characterization and Test of Next-generation D/A Convertors
Imaging Sensor Device Design
Characterization and Functional Testing of Next-generation Imaging
Devices (CCD/CMOS)
Jitter Transfer and Jitter Tolerance Testing
New serial data standards, expanding networks, and ubiquitous computing
continually redefine the cutting edge of technology. The design engineer is
challenged to economize without sacrificing performance.
The DTG5000 Series combines the power of a data generator with the
capabilities of a pulse generator in a versatile, benchtop form factor,
shortening the duration of complex test procedures and simplifying the
generation of low-jitter, high-accuracy clock signals, parallel or serial
data across multiple channels. Its modular platform allows you to
easily configure the performance of the instrument to your existing and
emerging needs to minimize equipment costs. Three mainframes and five
plug-in output modules combine to cover a range of applications from
legacy devices to the latest technologies. In addition, eight low-current,
independently-controlled DC outputs can substitute for external power
supplies. Each mainframe incorporates a full compliment of auxiliary input
and output channels to easily integrate with other instruments, such as
oscilloscopes and logic analyzers, to create a flexible and powerful lab.