Atec Keithley_2657A - Manual (Page 2)

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A Greater Measure of Confidence
www.keithley.com
1.888.KEITHLEY
(U.S. only)
Two Measurement Modes: Digitizing or Integrating
Precisely characterize transient and steady-state behavior, including rapidly changing thermal effects,
with the two measurement modes in the Model 2657A . Each mode is defined by its independent
analog-to-digital (A/D) converters .
The digitizing measurement mode provides speeds up to 1µs per sample . The dual 18-bit digitizers
allow you to capture voltage and current transients simultaneously . In the integrating measurement
mode, the dual 22-bit integrating analog to digital converters allow more precise measurement of volt-
age and current . Two A/D converters are used with each measurement mode, one for current and
the other for voltage, that run simultaneously for accurate source readback that does not sacrifice
test throughput .
0.0010
0.0008
0.0006
0.0004
0.0002
0.0000
–0.0002
–0.0004
–0.0006
–0.0008
–0.0010
–0.0012
0.000 0.005 0.010 0.015 0.020 0.025 0.030
Volta
ge (V)
Current (A)
Time (seconds)
700
600
500
400
300
200
100
0
–100
Current
Voltage
The dual high speed a/D converters sample as fast as 1µs per point, enabling full simultaneous
characterization of both voltage and current.
Expansion Capabilities
Through TSP-Link Technology technology, the Model 2657A can be linked with Series 2600B SMU
instruments to form a larger integrated system with up to 32 nodes . Precision timing and tight chan-
nel synchronization are guaranteed with built-in 500ns trigger controllers . The fully isolated, inde-
pendent channels of the SourceMeter SMU instruments make true SMU-per-pin testing possible .
High Power Device Test fixture
The Model 8010 High Power Device Test Fixture provides safe and easy connections for testing
packaged high power devices at up to 3000V or 100A . The Model 8010 provides connections for a
high voltage SourceMeter SMU instrument (Model 2657A), one or two high current SourceMeter SMU
instruments (Model 2651A), and three low power SourceMeter SMU instruments (Series 2600B or
Model 4200-SCS SMU instruments) . This allows devices with two terminals (diodes) or three termi-
nals (transistors) or even four or five terminals to be characterized safely and accurately . The Model
8010 has full interlock capability for up to six SourceMeter SMU instruments . The Model 8010 has
integrated protection circuits that protect the low voltage SourceMeter SMU instruments from high
voltages the Model 2657A can output should a device fault occur . The Model 8010 includes both a
high current (100A) and a high voltage (3000V) test socket . Various replacement test socket modules
are available, including TO-247, TO-220, axial lead, and a blank socket module that allows building
a custom socket . In addition to standard banana jumpers, the Model 8010 has rear-panel scope and
thermal probe ports to simplify system integration .
ordering Information
2657a High Power system
sourceMeter sMu
Instrument
8010 High Power Device
Test fixture
accessories supplied
7709-308a Digital I/o and
Interlock Connector
Ca-180-3a TsP-link/Ethernet Cable
Documentation CD
software tools and drivers CD
2657a High Power System SourceMeter
SMU Instrument
aCCEssorIEs aVaIlablE
2657A-LIM-3 Low Interconnect Module
2657A-PM-200 200V Protection Module
4299-6
Fixed Rack Mount Kit
SHV-CA-553-x High Voltage Triax to SHV Cable (1, 2, 3m)
HV-CA-554-x
High Voltage Triax to Triax Cable (0 .5, 1, 2, 3m)
HV-CA-571-3 High Voltage Triax to Unterminated Cable
HV-CS-1613 High Voltage Triax Feedthrough Connector
aCCEssorIEs suPPlIED WITH THE 8010
CA-558-2
25-pin D-sub Interlock Cable for 26xxA
CA-560-x 4mm Black and Red Banana Cables, 8 in .
CA-562-x 6mm Black and Red Banana Cables, 10 in .
CA-563 BNC to Banana Cable, 9 .5 in .
CA-568-120 Safety Earth Ground Cable
8010-DTB Device Test Board with TO-247 Socket
aCCEssorIEs aVaIlablE for THE 8010
8010-CTB
Customizable Test Board
8010-DTB-220 Device Test Board with TO-220 Socket (1 .5kV)
The Model 2657a can be combined with
series 2600b and Model 4200-sCs sMu
instruments to support multi-terminal
test capability. The Models 2657a-PM-200
Protection Module and 2657a-lIM-3 low
Interconnect Module make it easier to con-
nect multiple instruments to a probe station
safely (not required for connecting to the
Model 8010 High Power Device Test fixture).
2657A-LIM-3
2657A-PM-200 2657A
26xxB
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