Atec Agilent-E4916A User Manual

Page 2

Mobile radios and communicators

are increasingly expanding their

applications into homes and offices.

This makes the evaluation of crystal

resonator characteristics at higher

frequencies and/or lower drive levels

more critical. However, conventional

crystal impedance meters based on

the oscillation method cannot

properly meet the current measure-

ment needs due to the following

limitations on:

High-end measurement frequency

(60 MHz or below)

Applicable power level

The HP E4916A is a crystal imped-

ance meter based on the transmission

network method which enables you

to:

Test at high frequencies (1 MHz to

180 MHz)

Apply low drive level (0.1 nW to

1 mW, when testing a 25

Ω

DUT

with the

circuit).

The HP E4916A yet provides a cost

effective solution, comparable

enough to conventional CI meters.

In addition to Fr and CI measure-

ments, the HP E4916A offers a variety

of testing capabilities including the

equivalent circuit analysis and the

drive level dependency characteristic

evaluation (DLD) through easy-to-

follow steps. It comes with the HP-IB

and parallel I/O interfaces for easy

connection to external equipment,

thus allowing an automatic testing

system to be configured.

Front View

Rear View

Key Features

Based on the transmission

network method recommended by

the IEC444 standard.

Wide frequency range (1 MHz to

180 MHz)

Easy to change the drive level

(0.1 nW to 1 mW)

Applies up to 20 mW to the DUT

when used in combination with the

optional impedance probe (option

001)

Allows you to use the same test

fixtures as those for the network

analyzer.

Provides the

calibration to correct

errors resulting from the extension

of the cable.

Saves and recalls up to 10 patterns

of the system settings together with

calibration data.

Displays Fr, CI, and Equivalent
Circuit Parameters (Backlit LCD)

Parallel I/O Port

Drive Level Selectable between 0.1 nW and 1 mW
(No Adjustments Required)

Evaporation Monitoring Function

Drive Level Dependency
Characteristic Evaluation Function

Allows Testing at
up to 180 MHzv

Easy Pass/Fail Judgment
(No External PC Required)

RF Output

Reference Input

Test Signal Input

Analog Voltage Output

HP-IB Interface

External Trigger Input

External Reference Signal Input