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Maximum ratings, Thermal characteristics, Electrical characteristics – Diodes DMP2540UCB9 User Manual

Page 2

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DMP2540UCB9

Document number: DS35611 Rev. 4 - 2

2 of 6

www.diodes.com

June 2012

© Diodes Incorporated

DMP2540UCB9

NEW PROD

UC

T

ADVAN

CE I

N

F

O

RM

ATI

O

N





Maximum Ratings

@T

A

= 25°C unless otherwise specified

Characteristic Symbol

Value

Units

Drain-Source Voltage

V

DSS

-25 V

Gate-Source Voltage

V

GSS

-6 V

Continuous Drain Current (Note 5) V

GS

= -4.5V

Steady

State

T

A

= 25 C

T

A

= 70 C

I

D

-4.0
-3.0

A

Continuous Drain Current (Note 6) V

GS

= -4.5V

Steady

State

T

A

= 25 C

T

A

= 70 C

I

D

-5.2
-4.0

A

Pulsed Drain Current (Pulse duration 10

μs, duty cycle ≤1%)

I

DM

-30 A

Continuous Source Pin Current (Note 6)

I

S

-2.0 A

Pulsed Source Pin Current (Pulse duration 10

μs, duty cycle ≤1%)

I

SM

-15 A

Continuous Gate Clamp Current (Note 5)

I

G

-0.6 A

Pulsed Gate Clamp Current (Pulse duration 10

μs, duty cycle ≤1%)

I

GM

-8 A



Thermal Characteristics

@T

A

= 25°C unless otherwise specified

Characteristic Symbol

Value

Units

Total Power Dissipation (Note 5)

P

D

1.0 W

Total Power Dissipation (Note 6)

P

D

1.8 W

Thermal Resistance, Junction to Ambient (Note 5)

R

θJA

126.8 °C/W

Thermal Resistance, Junction to Ambient (Note 6)

R

θJA

69 °C/W

Operating and Storage Temperature Range

T

J,

T

STG

-55 to +150

°C



Electrical Characteristics

@T

A

= 25°C unless otherwise specified

Characteristic

Symbol

Min

Typ

Max

Unit

Test Condition

OFF CHARACTERISTICS (Note 7)
Drain-Source Breakdown Voltage

BV

DSS

-25 - - V

V

GS

= 0V, I

D

= -250

μA

Zero Gate Voltage Drain Current @T

C

= 25°C

I

DSS

- - -1

μA

V

DS

= -20V, V

GS

= 0V

Gate-Source Leakage

I

GSS

- -

-100

nA

V

GS

= -6V, V

DS

= 0V

ON CHARACTERISTICS (Note 7)
Gate Threshold Voltage

V

GS(th)

-0.4 -0.6 -1.1 V V

DS

= V

GS

, I

D

= -250

μA

Static Drain-Source On-Resistance

R

DS (ON)

-

33 40

m

V

GS

= -4.5V, I

D

= - 2A

42 50

V

GS

= -2.5V, I

D

= -2A

52 60

V

GS

= -1.8V, I

D

= -2A

Forward Transfer Admittance

|Y

fs

|

- 12 - S

V

DS

= -10V, I

D

= -2A

Diode Forward Voltage (Note 5)

V

SD

- -0.7 -1 V

V

GS

= 0V, I

S

= -2A

Reverse Recovery Charge

Q

rr

-

100

- nC

V

dd

= –9.5V, I

F

= –2A, di/dt =

200A/

μs

Reverse Recovery Time

t

rr

-

130

- ns

DYNAMIC CHARACTERISTICS (Note 8)
Input Capacitance

C

iss

- 342

450 pF

V

DS

= -10V, V

GS

= 0V,

f = 1.0MHz

Output Capacitance

C

oss

- 174

225 pF

Reverse Transfer Capacitance

C

rss

- 70 90 pF

Series Gate Resistance

R

G

28

35

V

DS

= 0V, V

GS

= 0V, f = 1.0MHz

Total Gate Charge (4.5V)

Q

g

- 4.8

6.0 nC

V

GS

= -4.5V, V

DS

= -10V,

I

D

= -2A

Gate-Source Charge

Q

gs

- 0.5 - nC

Gate-Drain Charge

Q

gd

- 1.0 - nC

Turn-On Delay Time

t

D(on)

- 11 - ns

V

DD

= -10V, V

GS

= -4.5V,

I

DS

= -2A, R

G

= 2

Ω,

Turn-On Rise Time

t

r

- 12 - ns

Turn-Off Delay Time

t

D(off)

- 56 - ns

Turn-Off Fall Time

t

f

- 42 - ns

Notes: 5.

Device mounted on FR-4 PCB with minimum recommended pad layout.

6. Device mounted on FR4 material with 1-inch

2

(6.45-cm

2

), 2-oz. (0.071-mm thick) Cu

7. Short duration pulse test used to minimize self-heating effect.
8. Guaranteed by design. Not subject to production testing.