National Instruments NI 5422 - Manual (Page 17)

© National Instruments Corporation 17 NI 5422 Specifications
System Phase Noise and Jitter (10 MHz Carrier)
Sample Clock
Source System Phase Noise
Density
(dBc/Hz) Offset
System Output Jitter
(Integrated from
100 Hz to 100 kHz)
1. High-
Resolution
specifications
vary with
Sample Rate.
2. Values are
typical.
3. PXI Star
trigger
specification is
valid when the
Sample Clock
Source is
locked to
PXI_CLK10.
100 Hz 1 kHz 10 kHz
Divide-by-N –110 –122 –138 1.5 ps rms
High-
Resolution
1
100 MS/s
–109 –120 –120 4.0 ps rms
High-
Resolution
1
200 MS/s
–108 –120 –122 4.2 ps rms
CLK IN 2 –116 –130 –143 1.1 ps rms
PXI Star
Trigger
2,3
–111 –128 –136 2.1 ps rms
External
Sample Clock
Input Jitter
Tolerance Cycle-Cycle Jitter ±150 ps
Period Jitter ±1 ns
—
Sample Clock Exporting
Exported
Sample Clock
Destinations 1. PFI<0..1> (SMB front panel connectors)
2. DDC CLK OUT (DIGITAL DATA & CONTROL front
panel connector)
3. PXI_Trig<0..6> (backplane connector)
Exported Sample
Clocks can be
divided by integer
K (1
≤ K ≤
4,194,304).
Exported
Sample Clock
Destinations
Maximum
Frequency
Jitter (Typical) Duty Cycle
—
PFI<0..1> 200 MHz PFI 0: 6 ps rms
PFI 1: 12 ps rms
25% to 65%
DDC CLK
OUT 200 MHz 60 ps rms 35% to 65%
PXI_Trig<0..6> 20 MHz — —
Table 2. (Continued)
Specification Value Comments