FUJITSU MHW2060AC - Manual (Page 132)

Interface
Table 5.19 Selective self-test log data structure
Offset Description Initial
00h, 01h Data Structure Revision Number 01h, 00h
02h...09h Starting LBA 00h...00h
0Ah...11h
Test Span 1
Ending LBA 00h...00h
12h...19h Starting LBA 00h...00h
1Ah...21h
Test Span 2
Ending LBA 00h...00h
22h...29h Starting LBA 00h...00h
2Ah...31h
Test Span 3
Ending LBA 00h...00h
32h...39h Starting LBA 00h...00h
3Ah...41h
Test Span 4
Ending LBA 00h...00h
42h...49h Starting LBA 00h...00h
4Ah...51h
Test Span 5
Ending LBA 00h...00h
52h...151h Reserved 00h...00h
152h...1EBh Vender Unique 00h...00h
1Ech...1F3h Current LBA under test 00h...00h
1F4h...1F5h Current Span under test 00h...00h
1F6h...1F7h Feature Flags 00h...00h
1F8h Offline Execution Flag 00h
1F9h Selective Offline Scan Number 00h
1FAh, 1FBh
Vender Unique
Reserved 00h, 00h
1FCh, 1FDh Selective Self-test pending time [min] 00h, 00h
1FEh, 1FFh Check sum 00h, FFh
• Test span
Selective self-test log provides for the definition of up to five test spans. If the
starting and ending LBA values for a test span are both zero, a test span is not
defined and not tested.
• Current LBA under test
As the self-test progress, the device shall modify this value to contain the LBA
currently being tested.
• Current span under test
As the self-test progress, the device shall modify this value to contain the test span
number currently being tested.
5-56 C141-E258