Test data registers, Table 4 - boundary-scan register, Table 4 - boundary scan register – Mitel DISTRIBUTED HYPERCHANNEL MT90840 User Manual
Page 25: Preliminary information
Preliminary Information
MT90840
2-255
Test Data Registers
As specified in the IEEE 1149.1 Standard, the
MT90840 JTAG interface contains two test data
registers:
•
The Boundary Scan Register consists of a
series of Boundary-Scan Cells arranged to form
a scan path around the boundary of the core
logic of the MT90840.
•
The Bypass Register is a single stage
shift-register that provides a one-bit path that
minimizes the distance for test data shifting
from the MT90840’s TDI to its TDO.
The MT90840 Boundary-Scan register contains 107
bits. The suffix (‘in’, ‘out’, or ‘en’) indicates the nature
and direction of the BSC. Bit 1 in Table 4 is the first
bit clocked out. All tristate enable bits are asserted
HIGH (i.e. a logic 1 enables the corresponding group
of output/bidirectional pins). Note that clocking all
zeros into the scan path register will set all outputs to
tristate (outputs disabled).
Please visit our web site at www.semicon.mitel.com
to download a BSDL file for the MT90840.
Cells
Definition
Note
1
ppfri_in
first bit
out
2
pckt_in
3
pckr_in
4:11
pdi<0:7>_in
12:14
ppft_en, ppft_out, ppft_in
15:22
pdo<0:7>_out
23
pdo_en
enables
pdo<0:7
>outputs
24:27
cto<0:3>_out
always
enabled
28
c48r2_in
29:31
f0_en, f0_out, f0_in
32
c48r1_in
33:35
sti<7>_en, sti<7>_out,
sti<7>_in
36:53
sti<6>, sti<5>, ... sti<1>
54:56
sti<0>_en, sti<0>_out,
sti<0>_in
57
res_in
Table 4 - Boundary-Scan Register
Cells
Definitions
Note
58
irq_en
tied
HIGH
internally
59
irq_out
60
dta_out
‘pseudo’
open-dra
in
61
cs_in
62
asale_in
63
dsrdb_in
pin: ds/rd
64
wrb_in
pin:
r/w\wr
65:66
ad<7>_out, ad<7>_in
67:78
ad<6>, ad<5>, ... ad<1>
79:80
ad<0>_out, ad<0>_in
81
ad_en
enables
ad<0:7>
outputs
82:84
sto<0>_en, sto<0>_out,
sto<0>_in
85:102
sto<1>, sto<2>, ... sto<6>
103:105
sto<7>_en, sto<7>_out,
sto<7>_in
106:107
spcko_en, spcko_out
Table 4 - Boundary Scan Register