Measurement Computing USB-1616FS - Manual (Page 22)

22
Chapter 4
Specifications
All specifications are subject to change without notice.
Typical for 25 °C unless otherwise specified.
Specifications in italic text are guaranteed by design.
Analog input
Table 1. AI specifications
Parameter Conditions Specification
A/D converters 16-bit, SAR type
Number of channels 16 single-ended
Input configuration Individual A/D per channel
Sampling method Simultaneous
Absolute maximum input
voltage CHx IN to GND ±15 V max
Input impedance 100 MΩ, min
Input bandwidth (–3 dB) 50 kHz typ
Input leakage current ±1 µA typ
Input capacitance 50 pf typ
Offset temperature drift 15 ppm/°C typ
Gain temperature drift All ranges 35 ppm/°C typ
Input ranges Software selectable ±10 V, ±5 V, ±2 V, ±1 V
Sampling rate Scan to PC memory 0.6 S/s to 50 kS/s, software programmable
Burst scan to 32 k
sample FIFO 20 S/s to 50 kS/s, software programmable
Throughput Software paced 30 S/s to 500 S/s all channels; throughput is system
dependant)
Scan to PC memory Refer to the Single Board Throughput and Multiple Board
Throughput sections that follow this table.
Burst scan to 32 k
sample FIFO = (200 kS/s) / (# of channels), max of 50 kS/s for any channel
Gain queue Software configurable. Sixteen elements, one gain element per
channel.
Resolution 16 bits
No missing codes 15 bits
Crosstalk DC – 25 kHz (sine) –80 dB min
Calibration voltages 0 V, ±0.625 V, ±1.25 V, ±2.5 V, ±5.0 V, software selectable
Calibration voltage
accuracy (Note 1) ±0.5% typ, ±1.0% max
Temperature sensor range 0 °C to +70 °C max
Temperature sensor
accuracy ±3 °C typ
Trigger source Software selectable External digital: TRIG_IN
Note 1: Actual values used for calibration are measured and stored in EEPROM.